Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- integrated circuit modeling 10 Treffer
- mathematical model 9 Treffer
- spice 9 Treffer
- compact model 8 Treffer
- magnetic tunnel junction (mtj) 7 Treffer
-
45 weitere Werte:
- semiconductor device modeling 7 Treffer
- simulation framework 7 Treffer
- components, circuits, devices and systems 6 Treffer
- capacitors 5 Treffer
- hybrid design 5 Treffer
- communication, networking and broadcast technologies 4 Treffer
- complementary metal oxide semiconductors 4 Treffer
- computer simulation 4 Treffer
- computing and processing 4 Treffer
- electric potential 4 Treffer
- engineered materials, dielectrics and plasmas 4 Treffer
- ferromagnetic materials 4 Treffer
- stt-mram 3 Treffer
- bioengineering 2 Treffer
- computational modeling 2 Treffer
- engineering profession 2 Treffer
- fields, waves and electromagnetics 2 Treffer
- fitting 2 Treffer
- general topics for engineers 2 Treffer
- landau-lifshitz-gilbert (llg) equation 2 Treffer
- magnetization 2 Treffer
- mathematical models 2 Treffer
- mtj 2 Treffer
- photonics and electrooptics 2 Treffer
- power, energy and industry applications 2 Treffer
- robotics and control systems 2 Treffer
- signal processing and analysis 2 Treffer
- spin transfer torque (stt) 2 Treffer
- spintronics 2 Treffer
- switching probability 2 Treffer
- temperature dependence 2 Treffer
- aerospace 1 Treffer
- antiferromagnetic 1 Treffer
- differential equations 1 Treffer
- entropy 1 Treffer
- exchange bias 1 Treffer
- geoscience 1 Treffer
- llg 1 Treffer
- magnetic random access memory 1 Treffer
- magnetic tunnel junction 1 Treffer
- memristors 1 Treffer
- metals 1 Treffer
- mram 1 Treffer
- nuclear engineering 1 Treffer
- numerical methods 1 Treffer
Verlag
Publikation
- ieee transactions on electron devices 5 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 2 Treffer
- 2012 design, automation & test in europe conference & exhibition (date) 1 Treffer
- 2012 design, automation & test in europe conference & exhibition (date), design, automation & test in europe conference & exhibition (date), 2012 1 Treffer
- 2019 design, automation & test in europe conference & exhibition (date), design, automation & test in europe conference & exhibition (date), 2019 1 Treffer
- 2 weitere Werte:
Sprache
6 Treffer
-
In: IEEE Transactions on Electron Devices, Jg. 71 (2024), Heft 1, S. 57-61Online academicJournalZugriff:
-
In: Electrical Engineering (ICEE), Iranian Conference on, 2018-05-01, S. 250-254KonferenzZugriff:
-
In: 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012-03-01, S. 1443-1446Online KonferenzZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 60 (2013-09-01), Heft 9, S. 2808-2814Online academicJournalZugriff:
-
In: 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019-03-01, S. 264-267KonferenzZugriff:
-
In: IEEE Access, Jg. 8 (2020), S. 50792-50800Online academicJournalZugriff: