Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary metal oxide semiconductors 4 Treffer
- noise 4 Treffer
- cmos image sensor 3 Treffer
- digital images 3 Treffer
- dynamic range 3 Treffer
-
45 weitere Werte:
- image sensors 3 Treffer
- metal oxide semiconductors 3 Treffer
- photoelectric devices 3 Treffer
- arrays 2 Treffer
- cameras 2 Treffer
- readout electronics 2 Treffer
- signal-to-noise ratio (snr) 2 Treffer
- size 0.18 mum 2 Treffer
- threshold voltage 2 Treffer
- transistors 2 Treffer
- 3-d imaging 1 Treffer
- amplifiers 1 Treffer
- avalanche photodiode (apd) 1 Treffer
- biology 1 Treffer
- capacitance 1 Treffer
- capacitance-voltage characteristics 1 Treffer
- capacitive sensor 1 Treffer
- capacitive-sensor interface 1 Treffer
- capacitors 1 Treffer
- charge coupled devices 1 Treffer
- circuit feedback 1 Treffer
- cmos imager 1 Treffer
- cmos imagers 1 Treffer
- cmos process 1 Treffer
- complementary metal oxide semiconductor (cmos) 1 Treffer
- complementary metal-oxide-semiconductor 1 Treffer
- computerised instrumentation 1 Treffer
- correlated double sampling 1 Treffer
- crosstalk 1 Treffer
- current conveyor 1 Treffer
- current conveyors 1 Treffer
- current mode circuits 1 Treffer
- current-mode circuits 1 Treffer
- dark current 1 Treffer
- delta-sigma modulation 1 Treffer
- delta-sigma modulator 1 Treffer
- demodulation 1 Treffer
- detector circuits 1 Treffer
- electric current converters 1 Treffer
- electric inverters 1 Treffer
- electric sensing devices 1 Treffer
- electrodes 1 Treffer
- embedded system 1 Treffer
- embedded systems 1 Treffer
- feedback mechanism 1 Treffer
Publikation
Sprache
10 Treffer
-
In: IEEE Transactions on Electron Devices, Jg. 63 (2016), Heft 1, S. 57-64Online academicJournalZugriff:
-
In: IEEE Journal of Solid-State Circuits, Jg. 48 (2013-10-01), Heft 10, S. 2522-2530Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 63 (2016), Heft 1, S. 106-112Online academicJournalZugriff:
-
In: IEEE Journal of Solid-State Circuits, Jg. 48 (2013-10-01), Heft 10, S. 2469-2477Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 63 (2016), Heft 1, S. 145-152Online academicJournalZugriff:
-
In: 2012 IEEE International Symposium on Circuits & Systems, 2012, S. 2063-2066KonferenzZugriff:
-
In: IEEE Sensors Journal, Jg. 14 (2014-03-01), Heft 3, S. 710-721Online academicJournalZugriff:
-
In: IEEE Sensors Journal, Jg. 12 (2012-06-01), Heft 6, S. 2172-2179Online academicJournalZugriff:
-
In: IEEE Sensors Journal, Jg. 12 (2012-05-01), Heft 5, S. 1004-1010Online academicJournalZugriff:
-
In: IEEE Transactions on Instrumentation & Measurement, Jg. 61 (2012-08-01), Heft 8, S. 2328-2330Online academicJournalZugriff: