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- strains and stresses -- thermal stresses 1 Treffer
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9 Treffer
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In: Journal of the Electrochemical Society, Jg. 127 (1980-11-02), S. 2433-2438academicJournalZugriff:
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In: Vacuum, Jg. 31 (1981-07-01), S. 309-313academicJournalZugriff:
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In: Journal of the Electrochemical Society, Jg. 127 (1980-11-02), S. 2518-2520academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 49 (1978-04-01), S. 2423-2426Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 74 (1999-03-29), Heft 13, S. 1830-1832Online academicJournalZugriff:
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Analysis of Water Diffusion Path Evolving From Silicon Dioxide and Its Influence on Transistor Hump.In: IEEE Transactions on Electron Devices, Jg. 53 (2006-04-01), Heft 4, S. 790-796Online academicJournalZugriff:
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In: Thin Solid Films, Jg. 520 (2012-10-01), Heft 24, S. 7041-7043academicJournalZugriff:
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In: Applied Physics Letters, Jg. 77 (2000-08-07), Heft 6, S. 842-844Online academicJournalZugriff:
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In: Applied Physics Letters, Jg. 88 (2006-03-06), Heft 10, S. 102105-102105Online academicJournalZugriff: