Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- silicon 20 Treffer
- logic gates 16 Treffer
- field-effect transistors 12 Treffer
- doping 8 Treffer
- finfet 8 Treffer
-
45 weitere Werte:
- gallium arsenide 8 Treffer
- gate-all-around (gaa) 8 Treffer
- germanium 8 Treffer
- logic circuits 8 Treffer
- performance evaluation 8 Treffer
- quantum wells 8 Treffer
- semiconductor process modeling 8 Treffer
- semiconductor wafers 8 Treffer
- strain 8 Treffer
- strained germanium 8 Treffer
- stress 8 Treffer
- tunneling 8 Treffer
- annealing 4 Treffer
- band-to-band tunneling 4 Treffer
- biaxial strain 4 Treffer
- boron 4 Treffer
- buffer solutions 4 Treffer
- charge carrier processes 4 Treffer
- charge carriers 4 Treffer
- chemical vapor deposition 4 Treffer
- chemical vapor deposition (cvd) 4 Treffer
- computer-aided design 4 Treffer
- current measurement 4 Treffer
- delta doping 4 Treffer
- elasticity 4 Treffer
- electric conductivity 4 Treffer
- electric measurements 4 Treffer
- electron mobility 4 Treffer
- epitaxial growth 4 Treffer
- epitaxy 4 Treffer
- fabrication 4 Treffer
- fabrication (manufacturing) 4 Treffer
- field-induced quantum confinement (fiqc) 4 Treffer
- finfets 4 Treffer
- heterojunctions 4 Treffer
- hydrogen 4 Treffer
- ionic mobility 4 Treffer
- layout 4 Treffer
- line tunneling 4 Treffer
- low temperatures 4 Treffer
- metal oxide semiconductors 4 Treffer
- mos devices 4 Treffer
- mosfets 4 Treffer
- nanowire (nw) 4 Treffer
- nanowires 4 Treffer
Sprache
6 Treffer
-
In: IEEE Transactions on Electron Devices, Jg. 65 (2018-11-01), Heft 11, S. 5145-5150Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 64 (2017-11-01), Heft 11, S. 4587-4593Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 61 (2014-12-01), Heft 12, S. 3985-3990Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 61 (2014-03-01), Heft 3, S. 707-715Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 59 (2012-03-01), Heft 3, S. 602-609Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 58 (2011-08-01), Heft 8, S. 2544-2550Online academicJournalZugriff: