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In: IEEE Transactions on Reliability, Jg. 71 (2022-06-01), Heft 2, S. 1141-1156Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 71 (2022-03-01), Heft 1, S. 162-177Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 67 (2018-09-01), Heft 3, S. 870-884Online academicJournalZugriff:
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In: IEEE Transactions on Software Engineering, Jg. 41 (2015), Heft 1, S. 65-81Online academicJournalZugriff:
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In: IEEE Transactions on Software Engineering, Jg. 39 (2013-04-01), Heft 4, S. 552-569Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 68 (2019-09-01), Heft 3, S. 1134-1153Online academicJournalZugriff:
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In: IEEE Transactions on Software Engineering, Jg. 40 (2014-04-01), Heft 4, S. 366-380Online academicJournalZugriff:
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In: IEEE Transactions on Parallel & Distributed Systems, Jg. 30 (2019-05-01), Heft 5, S. 990-1006Online academicJournalZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, Jg. 38 (2019-03-01), Heft 3, S. 419-429Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 68 (2019-03-01), Heft 1, S. 2-22Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 65 (2016-09-01), Heft 3, S. 1094-1113Online academicJournalZugriff:
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In: IEEE Transactions on Knowledge & Data Engineering, Jg. 27 (2015), Heft 1, S. 264-280Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 71 (2022-12-01), Heft 4, S. 1540-1554Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 65 (2016-03-01), Heft 1, S. 70-87Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 71 (2022-06-01), Heft 2, S. 803-817Online academicJournalZugriff:
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In: Computing in Science & Engineering, Jg. 24 (2022-11-01), Heft 6, S. 54-59Online academicJournalZugriff:
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In: IEEE Transactions on Knowledge & Data Engineering, Jg. 34 (2022-12-01), Heft 12, S. 5854-5868Online academicJournalZugriff:
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In: IEEE Transactions on Parallel & Distributed Systems, Jg. 33 (2022-07-01), Heft 7, S. 1711-1724Online academicJournalZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, Jg. 40 (2021-06-01), Heft 6, S. 1158-1171Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 71 (2022-03-01), Heft 1, S. 250-263Online academicJournalZugriff: