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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- static noise margin 6 Treffer
- cmos inverter 5 Treffer
- threshold voltage 5 Treffer
- leakage current 4 Treffer
- read operation 4 Treffer
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45 weitere Werte:
- sense amplifier 4 Treffer
- soft error 4 Treffer
- technology node 4 Treffer
- equivalent oxide thickness 3 Treffer
- ring oscillator 3 Treffer
- word line 3 Treffer
- access time 2 Treffer
- cmos circuit 2 Treffer
- cmos transistor 2 Treffer
- compact model 2 Treffer
- drain induce barrier lowering 2 Treffer
- fault model 2 Treffer
- gate oxide 2 Treffer
- leakage power 2 Treffer
- logic block 2 Treffer
- logic gate 2 Treffer
- memory array 2 Treffer
- memory cell 2 Treffer
- negative bias temperature instability 2 Treffer
- noise margin 2 Treffer
- pmos transistor 2 Treffer
- short channel effect 2 Treffer
- spice simulation 2 Treffer
- standby mode 2 Treffer
- statistical variability 2 Treffer
- storage node 2 Treffer
- technology scaling 2 Treffer
- area overhead 1 Treffer
- atomic layer deposition 1 Treffer
- automate test equipment 1 Treffer
- back gate 1 Treffer
- background illumination 1 Treffer
- basic circuit 1 Treffer
- binary decision diagram 1 Treffer
- bipolar device 1 Treffer
- body contact 1 Treffer
- boltzmann equation 1 Treffer
- cache hierarchy 1 Treffer
- cache system 1 Treffer
- charge carrier transport 1 Treffer
- charge collection 1 Treffer
- charge pump 1 Treffer
- circuit simulation 1 Treffer
- circuit under test 1 Treffer
- clock cycle 1 Treffer
Verlag
Publikation
- cmos sram circuit design and parametric test in nano-scaled technologies : process-aware sram design and test 5 Treffer
- bicmos technology and applications 2 Treffer
- cmos test and evaluation : a physical perspective 2 Treffer
- defect-oriented testing for nano-metric cmos vlsi circuits : 2nd edition 2 Treffer
- emerging technologies and circuits 2 Treffer
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39 weitere Werte:
- low power and reliable sram memory cell and array design 2 Treffer
- nanometer cmos ics : from basics to asics 2 Treffer
- nanoscale memory repair 2 Treffer
- a biologically inspired cmos image sensor 1 Treffer
- advances in optical science and engineering : proceedings of the first international conference, iem optronix 2014 1 Treffer
- analog circuit design : robust design, sigma delta converters, rfid 1 Treffer
- chips 2020 : a guide to the future of nanoelectronics 1 Treffer
- chips 2020 vol. 2 : new vistas in nanoelectronics 1 Treffer
- circuit design for cmos vlsi 1 Treffer
- cmos vlsi engineering : silicon-on-insulator (soi) 1 Treffer
- compact modeling : principles, techniques and applications 1 Treffer
- computing with memory for energy-efficient robust systems 1 Treffer
- emerging electronics and automation : select proceedings of e2a 2021 1 Treffer
- energy efficient microprocessor design 1 Treffer
- extreme statistics in nanoscale memory design 1 Treffer
- field-programmable custom computing technology: architectures, tools, and applications 1 Treffer
- finfets and other multi-gate transistors 1 Treffer
- innovations and advanced techniques in systems, computing sciences and software engineering 1 Treffer
- integrated circuit and system design. power and timing modeling, optimization and simulation : 15th international workshop, patmos 2005, leuven, belgium, september 21-23, 2005. proceedings 1 Treffer
- integrated circuit and system design. power and timing modeling, optimization and simulation : 17th international workshop, patmos 2007, gothenburg, sweden, september 3-5, 2007. proceedings 1 Treffer
- integrated circuit and system design. power and timing modeling, optimization and simulation : 18th international workshop, patmos 2008, lisbon, portugal, september 10-12, 2008. revised selected papers 1 Treffer
- leakage in nanometer cmos technologies 1 Treffer
- micro and nanoelectronics devices, circuits and systems : select proceedings of mndcs 2023 1 Treffer
- microelectronic test structures for cmos technology 1 Treffer
- micro-relay technology for energy-efficient integrated circuits 1 Treffer
- nanotechnology for electronic materials and devices 1 Treffer
- numerical methods and applications : 7th international conference, nma 2010, borovets, bulgaria, august 20-24, 2010. revised papers 1 Treffer
- planar double-gate transistor : from technology to circuit 1 Treffer
- predictive technology model for robust nanoelectronic design 1 Treffer
- radiation effects on embedded systems 1 Treffer
- simulation of semiconductor processes and devices 2007 : sispad 2007 1 Treffer
- spintronics-based computing 1 Treffer
- sram design for wireless sensor networks : energy efficient and variability resilient techniques 1 Treffer
- supercollider 5 1 Treffer
- taking aims at digital design : analysis, improvement, modeling, and synthesis 1 Treffer
- transistor level modeling for analog/rf ic design 1 Treffer
- variation-aware advanced cmos devices and sram 1 Treffer
- vlsi memory chip design 1 Treffer
- vlsi-soc: advanced topics on systems on a chip : a selection of extended versions of the best papers of the fourteenth international conference on very large scale integration of system on chip (vlsi-soc2007), october 15-17, 2007, atlanta, usa 1 Treffer
Sprache
55 Treffer
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In: Taking AIMS at Digital Design : Analysis, Improvement, Modeling, and Synthesis; (2023) S. 17-44Online E-BookZugriff:
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In: Nanometer CMOS ICs : From Basics to ASICs; (2017) S. 429-493Online E-BookZugriff:
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2007Online E-BookZugriff:
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In: CMOS VLSI Engineering : Silicon-on-Insulator (SOI); (1998) S. 71-120Online E-BookZugriff:
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In: Nanometer CMOS ICs : From Basics to ASICs; (2017) S. 249-320Online E-BookZugriff:
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2016Online E-BookZugriff:
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In: CMOS Test and Evaluation : A Physical Perspective; (2015) S. 201-239Online E-BookZugriff:
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In: CMOS Test and Evaluation : A Physical Perspective; (2015) S. 159-199Online E-BookZugriff:
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2024Online E-BookZugriff:
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2008Online E-BookZugriff:
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2013Online E-BookZugriff:
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In: Microelectronic Test Structures for CMOS Technology; (2011) S. 139-172Online E-BookZugriff:
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2008Online E-BookZugriff:
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2008Online E-BookZugriff:
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2008Online E-BookZugriff:
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2008Online E-BookZugriff:
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2007Online E-BookZugriff:
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In: Leakage in Nanometer CMOS Technologies; (2006) S. 163-199Online E-BookZugriff:
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In: Circuit Design for CMOS VLSI; (1992) S. 345-393Online E-BookZugriff:
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In: Extreme Statistics in Nanoscale Memory Design; (2010) S. 17-49Online E-BookZugriff: