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In: Integration: The VLSI Journal, Jg. 91 (2023-07-01), S. 136-143academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 62 (2018-06-01), S. 246-257academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 97 (2024-07-01), S. N.PAGacademicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 50 (2015-06-01), S. 28-38academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 87 (2022-11-01), S. 205-210academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 87 (2022-11-01), S. 284-292academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 88 (2023), S. 362-370academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 88 (2023), S. 58-69academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 73 (2020-07-01), S. 101-113academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 82 (2022), S. 89-95academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 82 (2022), S. 127-135academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 69 (2019-11-01), S. 279-288academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 65 (2019-03-01), S. 51-73academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 55 (2016-09-01), S. 212-219academicJournalZugriff: