Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Schlagwort
- business 59 Treffer
- business.industry 59 Treffer
- cmos 55 Treffer
- atomic and molecular physics, and optics 38 Treffer
- instrumentation 32 Treffer
-
45 weitere Werte:
- law 32 Treffer
- law.invention 32 Treffer
- metals and alloys 30 Treffer
- electrical engineering 25 Treffer
- 01 natural sciences 24 Treffer
- 0103 physical sciences 23 Treffer
- optics 23 Treffer
- optoelectronics 23 Treffer
- 010302 applied physics 20 Treffer
- safety, risk, reliability and quality 20 Treffer
- 02 engineering and technology 19 Treffer
- electronic engineering 18 Treffer
- detector 15 Treffer
- 0210 nano-technology 13 Treffer
- 021001 nanoscience & nanotechnology 13 Treffer
- hardware_integratedcircuits 13 Treffer
- hardware_performanceandreliability 10 Treffer
- transistor 9 Treffer
- voltage 9 Treffer
- acoustics and ultrasonics 7 Treffer
- chemistry 7 Treffer
- integrated circuit 7 Treffer
- mosfet 7 Treffer
- photodiode 7 Treffer
- physics::instrumentation and detectors 7 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 6 Treffer
- 020208 electrical & electronic engineering 6 Treffer
- diode 6 Treffer
- dynamic range 6 Treffer
- electronic circuit 6 Treffer
- hardware_logicdesign 6 Treffer
- symbols 6 Treffer
- symbols.namesake 6 Treffer
- chemistry.chemical_element 5 Treffer
- image sensor 5 Treffer
- magnetic field 5 Treffer
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 4 Treffer
- 010308 nuclear & particles physics 4 Treffer
- 010309 optics 4 Treffer
- computer science::hardware architecture 4 Treffer
- engineering physics 4 Treffer
- image resolution 4 Treffer
- materials chemistry 4 Treffer
- materials science 4 Treffer
- monte carlo method 4 Treffer
Verlag
Publikation
Sprache
77 Treffer
-
In: Microelectronics Reliability, Jg. 91 (2018-12-01), S. 278-282Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 268 (2017-12-01), S. 9-15Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 117 (2021-02-01), S. 114038-114038Online unknownZugriff:
-
Single Event Upsets characterization of 65 nm CMOS 6T and 8T SRAM cells for ground level environmentIn: Microelectronics Reliability, Jg. 110 (2020-07-01), S. 113696-113696Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 303 (2020-03-01), S. 111862-111862Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 211 (2014-05-01), S. 60-66Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 201 (2013-10-01), S. 342-351Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 178 (2012-05-01), S. 64-75Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 124 (2021-09-01), S. 114337-114337Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 51 (2011-09-01), S. 1498-1502Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 182 (2012-08-01), S. 6-15Online unknownZugriff:
-
Highly linear wide input range CMOS OTA architectures operating in subthreshold and strong inversionIn: Microelectronic Engineering, Jg. 84 (2007-02-01), S. 273-279Online unknownZugriff:
-
In: Conference on Lasers and Electro-Optics, 2016Online unknownZugriff:
-
In: Microelectronic Engineering, Jg. 85 (2008), S. 227-232Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 118 (2005-02-01), S. 292-297Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 110 (2004-02-01), S. 124-129Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 109 (2004), S. 220-230Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, 2006-08-01, S. 273-281Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 46 (2006-09-01), S. 1504-1507Online unknownZugriff:
-
In: Microelectronic Engineering, Jg. 69 (2003-09-01), S. 274-278Online unknownZugriff: