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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- chimie generale, chimie physique 6 Treffer
- general chemistry, physical chemistry 6 Treffer
- nanotechnologies, nanostructures, nanoobjects 6 Treffer
- nanotechnologies, nanostructures, nanoobjets 6 Treffer
- spectrometrie auger 6 Treffer
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45 weitere Werte:
- aes 5 Treffer
- chemical composition analysis, chemical depth and dopant profiling 4 Treffer
- cristallographie cristallogenese 4 Treffer
- crystallography 4 Treffer
- depth profiles 4 Treffer
- essais sur les materiaux 4 Treffer
- materials testing 4 Treffer
- metal transition 4 Treffer
- profil profondeur 4 Treffer
- solid surfaces and solid-solid interfaces 4 Treffer
- surfaces solides et interfaces solide-solide 4 Treffer
- multicouche 3 Treffer
- multilayers 3 Treffer
- pulverisation irradiation 3 Treffer
- silicium 3 Treffer
- silicon 3 Treffer
- sputtering 3 Treffer
- transition elements 3 Treffer
- angle incidence 2 Treffer
- applied sciences 2 Treffer
- compose mineral 2 Treffer
- condensed matter: electronic structure, electrical, magnetic, and optical properties 2 Treffer
- couche mince 2 Treffer
- cu 2 Treffer
- depth resolution 2 Treffer
- diffusion 2 Treffer
- electron and ion emission by liquids and solids; impact phenomena 2 Treffer
- emissions electronique et ionique; phenomenes d'impact 2 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 2 Treffer
- ge 2 Treffer
- germanium 2 Treffer
- incidence angle 2 Treffer
- inorganic compounds 2 Treffer
- low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties 2 Treffer
- metallurgie, soudage 2 Treffer
- metallurgy, welding 2 Treffer
- methodes de depot de films et de revetements; croissance de films et epitaxie 2 Treffer
- methods of deposition of films and coatings; film growth and epitaxy 2 Treffer
- resolucion profondidad 2 Treffer
- resolution profondeur 2 Treffer
- sciences appliquees 2 Treffer
- si 2 Treffer
- spectre photoelectron rx 2 Treffer
- structure and morphology; thickness 2 Treffer
- structure et morphologie de couches minces 2 Treffer
Verlag
Publikation
- surface and interface analysis 4 Treffer
- applied surface science 2 Treffer
- ecasia'01: proceedings of the 9th european conference on applications of surface and interface analysis, 30th september-5th october 2001, avignon, france 1 Treffer
- journal of crystal growth 1 Treffer
- physical review. b, condensed matter 1 Treffer
Sprache
8 Treffer
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In: Applied surface science, Jg. 256 (2009), Heft 3, S. 773-778academicJournalZugriff:
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In: Journal of crystal growth, Jg. 310 (2008), Heft 7-9, S. 1583-1589academicJournalZugriff:
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In: ECASIA'01: proceedings of the 9th European conference on applications of surface and interface analysis, 30th September-5th October 2001, Avignon, France, Jg. 34 (2002), Heft 1, S. 253-256Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 33 (2002), Heft 6, S. 461-471Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 39 (2007), Heft 4, S. 359-366Online academicJournalZugriff:
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In: Applied surface science, Jg. 252 (2006), Heft 16, S. 5877-5891academicJournalZugriff:
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Improvement of the depth resolution in sputter depth profiling by elastic peak electron spectroscopyIn: Surface and interface analysis, Jg. 33 (2002), Heft 8, S. 635-639Online academicJournalZugriff:
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In: Physical review. B, Condensed matter, Jg. 34 (1986), Heft 2, S. 913-920Online academicJournalZugriff: