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- temperature measurement 7 Treffer
- energy resolution 4 Treffer
- resistors 4 Treffer
- calibration 3 Treffer
- energy efficiency 3 Treffer
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45 weitere Werte:
- bridge circuits 2 Treffer
- dark current 2 Treffer
- frequency locked loops 2 Treffer
- semiconductor device measurement 2 Treffer
- sensitivity 2 Treffer
- smart sensors 2 Treffer
- system-on-chip 2 Treffer
- temperature compensation 2 Treffer
- 1/f noise 1 Treffer
- actuators 1 Treffer
- analog electronics 1 Treffer
- bandwidth 1 Treffer
- capacitors 1 Treffer
- chemical sensors 1 Treffer
- cmos 1 Treffer
- cmos analog integrated circuits 1 Treffer
- cmos image sensor (cis) 1 Treffer
- cmos process 1 Treffer
- cmos temperature sensor 1 Treffer
- cryo-cmos 1 Treffer
- cryogenics 1 Treffer
- duty-cycling 1 Treffer
- dynamic 1 Treffer
- electric resistance 1 Treffer
- electrodes 1 Treffer
- energy consumption 1 Treffer
- frequency control 1 Treffer
- frequency measurement 1 Treffer
- gas detectors 1 Treffer
- internet-of-things (iot) 1 Treffer
- jitter 1 Treffer
- logic gates 1 Treffer
- mismatch 1 Treffer
- modeling 1 Treffer
- monitoring 1 Treffer
- mosfets 1 Treffer
- oscillators 1 Treffer
- power demand 1 Treffer
- process variability 1 Treffer
- process variations 1 Treffer
- qubit 1 Treffer
- resistance 1 Treffer
- robustness 1 Treffer
- sc-ics: integrated chemical sensors 1 Treffer
- sdg 7 - affordable and clean energy 1 Treffer
Verlag
Publikation
- ieee journal of solid state circuits 3 Treffer
- 2018 ieee international solid-state circuits conference, isscc 2018 2 Treffer
- ieee journal of solid-state circuits 1 Treffer
- ieee journal of the electron devices society 1 Treffer
- ieee transactions on circuits and systems i: regular papers 1 Treffer
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18 Treffer
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In: IEEE Journal of Solid State Circuits, Jg. 57 (2022), Heft 8Online serialPeriodicalZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 8 (2020), Heft 1serialPeriodicalZugriff:
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In: IEEE Transactions on Circuits and Systems Part 2: Express Briefs, Jg. 67 (2020), Heft 2Online serialPeriodicalZugriff:
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In: Sensors, Jg. 19 (2019), Heft 4Online serialPeriodicalZugriff:
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In: 2018 IEEE International Solid-State Circuits Conference, ISSCC, Jg. 61 (2018)KonferenzZugriff:
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In: IEEE journal of solid-state circuits, Jg. 45 (2010-12-01), Heft 12, S. 2591-2601Online serialPeriodicalZugriff:
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In: 2018 IEEE International Solid-State Circuits Conference, ISSCC, Jg. 61 (2018)KonferenzZugriff:
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In: Digest of Technical Papers - 2017 Symposium on VLSI Circuits, 2017KonferenzZugriff:
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In: IEEE Journal of Solid State Circuits, Jg. 52 (2017), Heft 3Online serialPeriodicalZugriff:
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In: Digest of Technical Papers 2012 IEEE International Solid-state Circuits Conference, 2012KonferenzZugriff:
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In: IEEE Journal of Solid State Circuits, Jg. 53 (2018), Heft 1Online serialPeriodicalZugriff:
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2000HochschulschriftZugriff:
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In: 2017 IEEE International Solid-State Circuits Conference, ISSCC, 2017-02-01KonferenzZugriff:
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In: IEEE Transactions on Circuits and Systems I: Regular Papers, Jg. 69 (2022-02-01), Heft 2, S. 506-517Online serialPeriodicalZugriff:
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In: 2020 IEEE Custom Integrated Circuits Conference (CICC), 2020-03-23Online KonferenzZugriff:
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2015HochschulschriftZugriff:
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In: IEEE Journal of Solid-State Circuits, 44 (7), 2009, 2009-06-23Online serialPeriodicalZugriff:
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In: Proceedings of the IEEE Sensors Conference 2005, 2006-10-31, S. 1225-1228KonferenzZugriff: