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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- components, circuits, devices and systems 35 Treffer
- computing and processing 34 Treffer
- engineered materials, dielectrics and plasmas 29 Treffer
- signal processing and analysis 20 Treffer
- very large scale integration 14 Treffer
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45 weitere Werte:
- wafer scale integration 13 Treffer
- redundancy 11 Treffer
- communication, networking and broadcast technologies 10 Treffer
- silicon 9 Treffer
- switches 8 Treffer
- fault tolerance 7 Treffer
- circuit faults 6 Treffer
- costs 6 Treffer
- fabrication 6 Treffer
- general topics for engineers 6 Treffer
- clustering algorithms 5 Treffer
- computer architecture 5 Treffer
- delay 5 Treffer
- integrated circuit interconnections 5 Treffer
- logic arrays 5 Treffer
- degradation 4 Treffer
- fault detection 4 Treffer
- manufacturing 4 Treffer
- multiprocessor interconnection networks 4 Treffer
- routing 4 Treffer
- semiconductor device modeling 4 Treffer
- aerospace 3 Treffer
- application specific processors 3 Treffer
- chromium 3 Treffer
- fault diagnosis 3 Treffer
- fields, waves and electromagnetics 3 Treffer
- photonics and electrooptics 3 Treffer
- predictive models 3 Treffer
- production 3 Treffer
- silicides 3 Treffer
- training 3 Treffer
- ultra large scale integration 3 Treffer
- area measurement 2 Treffer
- artificial intelligence 2 Treffer
- assembly 2 Treffer
- binary trees 2 Treffer
- built-in self-test 2 Treffer
- cmos technology 2 Treffer
- computer science 2 Treffer
- contact resistance 2 Treffer
- context 2 Treffer
- contracts 2 Treffer
- controllability 2 Treffer
- convolution 2 Treffer
- decoding 2 Treffer
Verlag
Publikation
- 1990 proceedings. international conference on wafer scale integration, wafer scale integration, 1990. proceedings., [2nd] international conference on 4 Treffer
- ieee transactions on computers, computers, ieee transactions on, ieee trans. comput. 4 Treffer
- [1989] proceedings international conference on wafer scale integration, wafer scale integration, 1989. proceedings., [1st] international conference on 3 Treffer
- [1992] proceedings international conference on wafer scale integration, wafer scale integration, 1992. proceedings., [4th] international conference on 3 Treffer
- 1993 proceedings fifth annual ieee international conference on wafer scale integration, wafer scale integration, 1993. proceedings., fifth annual ieee international conference on 3 Treffer
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28 weitere Werte:
- 1991 proceedings, international conference on wafer scale integration, wafer scale integration, 1991. proceedings., [3rd] international conference on 2 Treffer
- ieee transactions on very large scale integration (vlsi) systems, very large scale integration (vlsi) systems, ieee transactions on, ieee trans. vlsi syst. 2 Treffer
- proceedings of 1994 international conference on wafer scale integration (icwsi), wafer scale integration, 1994. proceedings., sixth annual ieee international conference on 2 Treffer
- [1990] proceedings of the international conference on application specific array processors, application specific array processors, 1990. proceedings of the international conference on 1 Treffer
- [1991] proceedings, advanced computer technology, reliable systems and applications, compeuro '91. advanced computer technology, reliable systems and applications. 5th annual european computer conference. proceedings. 1 Treffer
- [1991] proceedings. fourth csi/ieee international symposium on vlsi design, vlsi design, 1991. proceedings., fourth csi/ieee international symposium on 1 Treffer
- [proceedings] 1991 international workshop on defect and fault tolerance on vlsi systems, defect and fault tolerance on vlsi systems, 1991. proceedings., 1991 international workshop on 1 Treffer
- 1991 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 1991 ieee international symposium on 1 Treffer
- 1994 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 1994 ieee international symposium on, circuits and systems 1 Treffer
- 2012 international conference on asian language processing, asian language processing (ialp), 2012 international conference on 1 Treffer
- 2014 ieee/wic/acm international joint conferences on web intelligence (wi) and intelligent agent technologies (iat), web intelligence (wi) and intelligent agent technologies (iat), 2014 ieee/wic/acm international joint conferences on 1 Treffer
- 2015 ieee 28th international symposium on computer-based medical systems, computer-based medical systems (cbms), 2015 ieee 28th international symposium on 1 Treffer
- 2021 9th international conference on reliability, infocom technologies and optimization (trends and future directions) (icrito), reliability, infocom technologies and optimization (trends and future directions) (icrito), 2021 9th international conference on 1 Treffer
- 27th annual proceedings., international reliability physics symposium, reliability physics symposium, 1989. 27th annual proceedings., international 1 Treffer
- 30th annual proceedings reliability physics 1992, reliability physics symposium 1992. 30th annual proceedings., international 1 Treffer
- ieee electron device letters, electron device letters, ieee, ieee electron device lett. 1 Treffer
- ieee transactions on artificial intelligence, artificial intelligence, ieee transactions on, ieee trans. artif. intell. 1 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 1 Treffer
- ieee transactions on semiconductor manufacturing, semiconductor manufacturing, ieee transactions on, ieee trans. semicond. manufact. 1 Treffer
- international technical digest on electron devices, electron devices meeting, 1990. iedm '90. technical digest., international 1 Treffer
- microwave and millimeter-wave monolithic circuits, microw. millim.-wave monolithic circuits 1 Treffer
- proceedings ieee international conference on wafer scale integration (icwsi), wafer scale integration, 1995. proceedings., seventh annual ieee international conference on, wafer scale integration 1 Treffer
- proceedings international conference on microelectronic test structures, microelectronic test structures, 1995. icmts 1995. proceedings of the 1995 international conference on, microelectronic test structures 1 Treffer
- proceedings of the fourteenth biennial university/government/industry microelectronics symposium (cat. no.01ch37197), university/government/industry microelectronics symposium, 2001. proceedings of the fourteenth biennial, university/government/industry microelectronics symposium 1 Treffer
- proceedings of the ieee 1991 national aerospace and electronics conference naecon 1991, aerospace and electronics conference, 1991. naecon 1991., proceedings of the ieee 1991 national 1 Treffer
- proceedings of the ieee, proc. ieee 1 Treffer
- proceedings of the second ieee symposium on parallel and distributed processing 1990, parallel and distributed processing, 1990. proceedings of the second ieee symposium on 1 Treffer
- proceedings., sixth international ieee vlsi multilevel interconnection conference, vlsi multilevel interconnection conference, 1989. proceedings., sixth international ieee 1 Treffer
48 Treffer
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In: [1992] Proceedings International Conference on Wafer Scale Integration, 1992, S. 75-84KonferenzZugriff:
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In: [1992] Proceedings International Conference on Wafer Scale Integration, 1992, S. 135-144KonferenzZugriff:
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In: Proceedings IEEE International Conference on Wafer Scale Integration (ICWSI), 1995, S. 22-32KonferenzZugriff:
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In: [1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design, 1991, S. 267-272KonferenzZugriff:
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In: [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications, CompEuro '91. Advanced Computer Technology, 1991, S. 685-689KonferenzZugriff:
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In: 1991 Proceedings, International Conference on Wafer Scale Integration, 1991, S. 134-140KonferenzZugriff:
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In: Proceedings of the Second IEEE Symposium on Parallel and Distributed Processing 1990, 1990, S. 527-530KonferenzZugriff:
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In: 1990 Proceedings. International Conference on Wafer Scale Integration, 1990, S. 329-338KonferenzZugriff:
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In: 1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration, 1993, S. 299-308KonferenzZugriff:
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In: 1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration, 1993, S. 279-288KonferenzZugriff:
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In: 1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration, 1993, S. 193-202KonferenzZugriff:
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In: 30th Annual Proceedings Reliability Physics 1992, 1992, S. 127-130KonferenzZugriff:
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In: 1991 Proceedings, International Conference on Wafer Scale Integration, 1991, S. 97-103KonferenzZugriff:
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In: 1991 IEEE International Symposium on Circuits and Systems (ISCAS), 1991, S. 2140-2143KonferenzZugriff:
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In: 1990 Proceedings. International Conference on Wafer Scale Integration, 1990, S. 13-19KonferenzZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 1 (1993-06-01), Heft 2, S. 224-228Online academicJournalZugriff:
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In: IEEE Transactions on Computers, Jg. 46 (1997-12-01), Heft 12, S. 1363-1371Online academicJournalZugriff:
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In: [1989] Proceedings International Conference on Wafer Scale Integration, 1989, S. 183-192KonferenzZugriff:
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In: [1989] Proceedings International Conference on Wafer Scale Integration, 1989, S. 309-316KonferenzZugriff:
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In: [1989] Proceedings International Conference on Wafer Scale Integration, 1989, S. 325-333KonferenzZugriff: