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Weniger Treffer
Gefunden in
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Schlagwort
- silicon 31 Treffer
- chemical vapor deposition 21 Treffer
- sputtering (physics) 21 Treffer
- optical properties 19 Treffer
- ferroelectricity 16 Treffer
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45 weitere Werte:
- epitaxy 14 Treffer
- metallic films 12 Treffer
- magnetron sputtering 11 Treffer
- microstructure 11 Treffer
- tellurides 11 Treffer
- solid state electronics 10 Treffer
- amorphous substances 9 Treffer
- cadmium 9 Treffer
- crystallography 9 Treffer
- semiconductors 9 Treffer
- solar cells 9 Treffer
- titanium 9 Treffer
- atomic force microscopy 8 Treffer
- bismuth 8 Treffer
- dielectrics 8 Treffer
- magnetic properties 8 Treffer
- perovskite 8 Treffer
- polarization (electricity) 8 Treffer
- polycrystals 8 Treffer
- pulsed laser deposition 8 Treffer
- cadmium compounds 7 Treffer
- electric properties of thin films 7 Treffer
- electrodes 7 Treffer
- ferroelectric thin films 7 Treffer
- gallium arsenide 7 Treffer
- semiconductor wafers 7 Treffer
- aluminum oxide 6 Treffer
- crystallization 6 Treffer
- dielectric devices 6 Treffer
- dielectric properties 6 Treffer
- electron microscopy 6 Treffer
- ellipsometry 6 Treffer
- lasers 6 Treffer
- microelectromechanical systems 6 Treffer
- oxygen 6 Treffer
- residual stresses 6 Treffer
- substrates (materials science) 6 Treffer
- superconductors 6 Treffer
- surface morphology 6 Treffer
- tellurium 6 Treffer
- temperature 6 Treffer
- thermal conductivity 6 Treffer
- zinc telluride 6 Treffer
- annealing of crystals 5 Treffer
- bismuth compounds 5 Treffer
Verlag
Sprache
268 Treffer
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In: Journal of Applied Physics, Jg. 71 (1992-06-01), S. 5635-5640Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 71 (1992-04-15), S. 3865-3869Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 71 (1992-04-15), S. 3870-3876Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 70 (1991-12-15), S. 7608-7612Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 70 (1991-09-01), S. 2688-2693Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 64 (1988-08-01), S. 1233-1237Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 60 (1986-07-15), S. 811-814Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 59 (1986-02-15), S. 1319-1322Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 59 (1986-02-15), S. 1259-1263Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 58 (1985-08-01), S. 1349-1355Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 107 (2010-08-01), Heft 8, S. 84111-1- (4S.)Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 96 (2004-11-15), Heft 10, S. 5701-5705Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 96 (2004-07-01), Heft 1, S. 590-595Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 130 (2021-07-07), Heft 1, S. 1-10Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 91 (2002), Heft 1, S. 308-316Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 90 (2001-12-01), Heft 11, S. 5564-5569Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 88 (2000-10-15), Heft 8, S. 4898-4903Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 88 (2000-10-15), Heft 8, S. 4628-4633Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 88 (2000-08-01), Heft 3, S. 1670-1673Online academicJournalZugriff:
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In: Journal of Applied Physics, Jg. 86 (1999-10-01), Heft 7, S. 3812-3821Online academicJournalZugriff: