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Weniger Treffer
Gefunden in
Schlagwort
- electronic, optical and magnetic materials 81 Treffer
- business 80 Treffer
- business.industry 80 Treffer
- cmos 69 Treffer
- hardware_logicdesign 55 Treffer
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45 weitere Werte:
- law 53 Treffer
- law.invention 53 Treffer
- transistor 47 Treffer
- electrical engineering 42 Treffer
- materials science 42 Treffer
- electronic engineering 40 Treffer
- materials chemistry 40 Treffer
- optoelectronics 40 Treffer
- engineering 33 Treffer
- atomic and molecular physics, and optics 28 Treffer
- surfaces, coatings and films 27 Treffer
- mosfet 25 Treffer
- 02 engineering and technology 22 Treffer
- hardware_general 22 Treffer
- voltage 21 Treffer
- 01 natural sciences 19 Treffer
- 0103 physical sciences 18 Treffer
- 010302 applied physics 18 Treffer
- electronic circuit 17 Treffer
- safety, risk, reliability and quality 16 Treffer
- 0210 nano-technology 13 Treffer
- 021001 nanoscience & nanotechnology 13 Treffer
- computer science 13 Treffer
- integrated circuit 12 Treffer
- inverter 11 Treffer
- reliability (semiconductor) 11 Treffer
- computer science::hardware architecture 10 Treffer
- gate oxide 10 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 9 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 9 Treffer
- silicon on insulator 9 Treffer
- low voltage 8 Treffer
- physics 8 Treffer
- subthreshold conduction 8 Treffer
- general materials science 7 Treffer
- industrial and manufacturing engineering 7 Treffer
- negative-bias temperature instability 7 Treffer
- pmos logic 7 Treffer
- radiation 7 Treffer
- transconductance 7 Treffer
- 020208 electrical & electronic engineering 6 Treffer
- computer science::emerging technologies 6 Treffer
- doping 6 Treffer
- field-effect transistor 6 Treffer
- nmos logic 6 Treffer
Verlag
- elsevier bv 46 Treffer
- institute of electrical and electronics engineers (ieee) 10 Treffer
- iop publishing 9 Treffer
- ieee 4 Treffer
- springer science and business media llc 4 Treffer
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13 weitere Werte:
- pleiades publishing ltd 2 Treffer
- trans tech publications, ltd. 2 Treffer
- elsevier 1 Treffer
- emerald 1 Treffer
- ieee / institute of electrical and electronics engineers incorporated:445 hoes lane:piscataway, nj 08854:(800)701-4333, (732)981-0060, email: subscription-service@ieee.org, internet: http://www.ieee.org, fax: (732)981-9667 1 Treffer
- ieee microwave theory and techniques society 1 Treffer
- informa uk limited 1 Treffer
- institute of electronics, information and communications engineers (ieice) 1 Treffer
- pergamon press 1 Treffer
- spie-intl soc optical eng 1 Treffer
- sumy state university 1 Treffer
- wiley 1 Treffer
- world scientific pub co pte lt 1 Treffer
Publikation
- solid-state electronics 20 Treffer
- microelectronics reliability 15 Treffer
- microelectronic engineering 7 Treffer
- journal of semiconductors 6 Treffer
- ieee transactions on semiconductor manufacturing 5 Treffer
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23 weitere Werte:
- microsystem technologies 3 Treffer
- ieee transactions on microwave theory and techniques 2 Treffer
- journal of display technology 2 Treffer
- materials science forum 2 Treffer
- russian microelectronics 2 Treffer
- semiconductor science and technology 2 Treffer
- 2004 ieee international reliability physics symposium. proceedings 1 Treffer
- 2006 19th international vacuum nanoelectronics conference 1 Treffer
- ieee transactions on electron devices 1 Treffer
- ieice electronics express 1 Treffer
- indrastra global 1 Treffer
- integrated ferroelectrics 1 Treffer
- international journal of nanoscience 1 Treffer
- journal of electronic materials 1 Treffer
- journal of micro/nanolithography, mems, and moems 1 Treffer
- materials science in semiconductor processing 1 Treffer
- microelectronics international 1 Treffer
- organic electronics 1 Treffer
- physica status solidi c 1 Treffer
- sensors and actuators a: physical 1 Treffer
- sensors and actuators b: chemical 1 Treffer
- smart materials and structures 1 Treffer
- superlattices and microstructures 1 Treffer
Sprache
95 Treffer
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 68 (2020-05-01), S. 1754-1762Online unknownZugriff:
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In: Microsystem Technologies, Jg. 25 (2018-08-30), S. 2301-2311Online unknownZugriff:
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In: Russian Microelectronics, Jg. 46 (2017-03-01), S. 139-148Online unknownZugriff:
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In: Microsystem Technologies, Jg. 23 (2016-05-27), S. 4245-4253Online unknownZugriff:
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In: Materials Science Forum, Jg. 858 (2016-05-01), S. 821-824Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 54 (2014-02-01), S. 397-403Online unknownZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-State Electronics, Jg. 91 (2014), S. 81-86Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 111 (2013-11-01), S. 256-260Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 126 (2021-11-01), S. 114275-114275Online unknownZugriff:
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Challenges and opportunity in performance, variability and reliability in sub-45nm CMOS technologiesIn: Microelectronics Reliability, Jg. 51 (2011-09-01), S. 1508-1514Online unknownZugriff:
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In: Solid-State Electronics, Jg. 54 (2010-09-01), S. 855-860Online unknownZugriff:
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In: physica status solidi c, Jg. 7 (2010-02-01), S. 440-443Online unknownZugriff:
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In: IEICE Electronics Express, Jg. 4 (2007), S. 701-706Online unknownZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 22 (2009-02-01), S. 196-203Online unknownZugriff:
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In: Solid-State Electronics, Jg. 49 (2005-10-01), S. 1702-1707Online unknownZugriff:
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In: Russian Microelectronics, Jg. 39 (2010), S. 54-62Online unknownZugriff: