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Weniger Treffer
Gefunden in
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Schlagwort
- business 1.789 Treffer
- business.industry 1.789 Treffer
- cmos 1.624 Treffer
- optoelectronics 1.391 Treffer
- electrical engineering 912 Treffer
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45 weitere Werte:
- law 874 Treffer
- law.invention 874 Treffer
- mosfet 705 Treffer
- transistor 690 Treffer
- electrical and electronic engineering 671 Treffer
- hardware_integratedcircuits 655 Treffer
- hardware_performanceandreliability 615 Treffer
- electronic, optical and magnetic materials 428 Treffer
- chemistry 386 Treffer
- hardware_logicdesign 372 Treffer
- voltage 359 Treffer
- electronic engineering 351 Treffer
- 02 engineering and technology 289 Treffer
- silicon on insulator 245 Treffer
- 01 natural sciences 241 Treffer
- chemistry.chemical_element 238 Treffer
- condensed matter physics 232 Treffer
- field-effect transistor 220 Treffer
- logic gate 220 Treffer
- nmos logic 212 Treffer
- 0103 physical sciences 211 Treffer
- hardware_general 204 Treffer
- gate oxide 200 Treffer
- 010302 applied physics 197 Treffer
- electronic circuit 193 Treffer
- leakage (electronics) 180 Treffer
- chemistry.chemical_compound 179 Treffer
- pmos logic 177 Treffer
- silicon 165 Treffer
- subthreshold conduction 162 Treffer
- metal gate 153 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 152 Treffer
- low voltage 149 Treffer
- 0210 nano-technology 141 Treffer
- 021001 nanoscience & nanotechnology 141 Treffer
- transconductance 133 Treffer
- doping 130 Treffer
- 020208 electrical & electronic engineering 126 Treffer
- voltage reference 112 Treffer
- inverter 108 Treffer
- ion implantation 98 Treffer
- nanotechnology 96 Treffer
- integrated circuit 95 Treffer
- negative-bias temperature instability 95 Treffer
- gate dielectric 92 Treffer
Verlag
- ieee 836 Treffer
- institute of electrical and electronics engineers (ieee) 383 Treffer
- elsevier bv 135 Treffer
- iop publishing 76 Treffer
- springer science and business media llc 69 Treffer
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45 weitere Werte:
- spie 38 Treffer
- ire 33 Treffer
- hal ccsd 25 Treffer
- the electrochemical society 19 Treffer
- institution of engineering and technology (iet) 18 Treffer
- wiley 15 Treffer
- springer singapore 14 Treffer
- japan soc. appl. phys 13 Treffer
- springer international publishing 11 Treffer
- springer netherlands 11 Treffer
- aip publishing 10 Treffer
- trans tech publications, ltd. 10 Treffer
- acm 9 Treffer
- the japan society of applied physics 8 Treffer
- aip 7 Treffer
- american vacuum soc 7 Treffer
- edp sciences 7 Treffer
- institute of electrical and electronics engineers inc. 7 Treffer
- institute of electronics, information and communications engineers (ieice) 7 Treffer
- mdpi ag 7 Treffer
- springer berlin heidelberg 7 Treffer
- american vacuum society 6 Treffer
- informa uk limited 6 Treffer
- springer us 6 Treffer
- american chemical society (acs) 5 Treffer
- ieee-inst electrical electronics engineers inc 5 Treffer
- royal society of chemistry (rsc) 5 Treffer
- world scientific pub co pte lt 5 Treffer
- ieee comput. soc 4 Treffer
- institute of advanced engineering and science 4 Treffer
- presses polytech. univ. romandes 4 Treffer
- the korean institute of electrical and electronic material engineers 4 Treffer
- acm press 3 Treffer
- aip publishing llc 3 Treffer
- elsevier 3 Treffer
- inderscience publishers 3 Treffer
- institute of electrical and electronics engineers 3 Treffer
- korean physical society 3 Treffer
- springer new york 3 Treffer
- acta physica sinica, chinese physical society and institute of physics, chinese academy of sciences 2 Treffer
- american scientific publishers 2 Treffer
- author(s) 2 Treffer
- crc press 2 Treffer
- ieee-inst electrical electronics engineers inc, 445 hoes lane, piscataway, nj 08855 usa 2 Treffer
- openalex 2 Treffer
Publikation
- ieee transactions on electron devices 124 Treffer
- ieee electron device letters 69 Treffer
- ieee transactions on nuclear science 69 Treffer
- japanese journal of applied physics 49 Treffer
- solid-state electronics 34 Treffer
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45 weitere Werte:
- spie proceedings 34 Treffer
- microelectronic engineering 24 Treffer
- microelectronics reliability 24 Treffer
- ieee transactions on circuits and systems ii: express briefs 22 Treffer
- ieee journal of solid-state circuits 20 Treffer
- ieee transactions on device and materials reliability 19 Treffer
- mrs proceedings 17 Treffer
- electronics letters 14 Treffer
- ecs transactions 13 Treffer
- ieee transactions on circuits and systems i: regular papers 13 Treffer
- microelectronics journal 13 Treffer
- 30th european solid-state device research conference 9 Treffer
- aip conference proceedings 9 Treffer
- ieee transactions on very large scale integration (vlsi) systems 9 Treffer
- silicon 9 Treffer
- analog integrated circuits and signal processing 8 Treffer
- journal of semiconductors 8 Treffer
- nanotechnology 8 Treffer
- 1982 international electron devices meeting 7 Treffer
- 2009 international semiconductor device research symposium 7 Treffer
- aeu - international journal of electronics and communications 7 Treffer
- ieee sensors journal 7 Treffer
- ieee transactions on nanotechnology 7 Treffer
- ieice transactions on electronics 7 Treffer
- 2000 ieee international soi conference. proceedings (cat. no.00ch37125) 6 Treffer
- 2008 9th international conference on solid-state and integrated-circuit technology 6 Treffer
- 32nd european solid-state device research conference 6 Treffer
- applied physics letters 6 Treffer
- ieee journal of the electron devices society 6 Treffer
- journal of computational electronics 6 Treffer
- materials science forum 6 Treffer
- 1981 international electron devices meeting 5 Treffer
- 1984 international electron devices meeting 5 Treffer
- 1999 symposium on vlsi technology. digest of technical papers (ieee cat. no.99ch36325) 5 Treffer
- 2005 ieee international symposium on circuits and systems 5 Treffer
- 2015 ieee international symposium on circuits and systems (iscas) 5 Treffer
- 2019 ieee international symposium on circuits and systems (iscas) 5 Treffer
- ieee access 5 Treffer
- journal of materials science: materials in electronics 5 Treffer
- le journal de physique colloques 5 Treffer
- proceedings of international electron devices meeting 5 Treffer
- proceedings. ieee international soi conference 5 Treffer
- sensors and actuators b: chemical 5 Treffer
- 1985 international electron devices meeting 4 Treffer
- 2000 ieee international symposium on circuits and systems. emerging technologies for the 21st century. proceedings (ieee cat no.00ch36353) 4 Treffer
Sprache
2.005 Treffer
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In: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Jg. 7 (2021-12-01), S. 193-200Online unknownZugriff:
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In: IEEE Sensors Journal, Jg. 21 (2021-12-15), S. 27282-27289Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-12-01), S. 6644-6647Online unknownZugriff:
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In: WSEAS TRANSACTIONS ON SYSTEMS, Jg. 20 (2021-08-10), S. 244-248Online unknownZugriff:
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In: IEEE Access, Jg. 9 (2021), S. 105606-105611Online unknownZugriff:
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In: IEEE Sensors Journal, Jg. 21 (2021-02-15), S. 4755-4763Online unknownZugriff:
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In: Silicon, Jg. 14 (2021-01-07), S. 1169-1177Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 42 (2021), S. 110-113Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 21 (2021-03-01), S. 2-8Online unknownZugriff:
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In: IEEE Sensors Journal, Jg. 21 (2021-01-15), S. 1294-1304Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-09-01), S. 3889-3893Online unknownZugriff:
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In: IET Circuits, Devices & Systems, Jg. 14 (2020-09-01), S. 908-914Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems II: Express Briefs, Jg. 67 (2020-09-01), S. 1494-1498Online unknownZugriff:
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In: IEEE Sensors Journal, Jg. 20 (2020-08-15), S. 8930-8937Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 8 (2020), S. 1184-1192Online unknownZugriff:
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In: Materials Science Forum, Jg. 1004 (2020-07-01), S. 1123-1128Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), S. 1540-1546Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems II: Express Briefs, Jg. 67 (2020-12-01), S. 2878-2882Online unknownZugriff: