Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- radiation effects 31 Treffer
- complementary metal oxide semiconductors 23 Treffer
- dark current 21 Treffer
- cmos image sensors 20 Treffer
- photodiodes 18 Treffer
-
45 weitere Werte:
- ionizing radiation 17 Treffer
- logic gates 17 Treffer
- cmos 16 Treffer
- radiation 15 Treffer
- image sensors 13 Treffer
- transistors 13 Treffer
- shallow trench isolation (sti) 12 Treffer
- cmos image sensor (cis) 11 Treffer
- ionizing radiation dosage 11 Treffer
- pinned photodiode (ppd) 11 Treffer
- protons 11 Treffer
- gamma rays 9 Treffer
- silicon 9 Treffer
- active pixel sensors 8 Treffer
- field-effect transistors 8 Treffer
- integrated circuits 8 Treffer
- radiation damage 8 Treffer
- annealing 7 Treffer
- degradation 7 Treffer
- metal oxide semiconductor field-effect transistors 7 Treffer
- mosfet 7 Treffer
- radiation hardening (electronics) 7 Treffer
- random telegraph signal (rts) 7 Treffer
- cmos technology 6 Treffer
- displacement damage dose (ddd) 6 Treffer
- interface states 6 Treffer
- monolithic active pixel sensor (maps) 6 Treffer
- neutrons 6 Treffer
- radiation hardening 6 Treffer
- x-rays 6 Treffer
- active pixel sensor (aps) 5 Treffer
- dielectrics 5 Treffer
- irradiation 5 Treffer
- silicon-on-insulator (soi) 5 Treffer
- trapped charge 5 Treffer
- charge transfer 4 Treffer
- heavy ions 4 Treffer
- image converters 4 Treffer
- layout 4 Treffer
- leakage currents 4 Treffer
- logic circuits 4 Treffer
- neutron irradiation 4 Treffer
- temperature measurement 4 Treffer
- active pixel sensors (aps) 3 Treffer
- cmos integrated circuits 3 Treffer
Sprache
53 Treffer
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1284-1292Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1835-1845Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-06-01), Heft 6, S. 1107-1113Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-02-01), Heft 2, S. 268-277Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1241-1250Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-05-01), Heft 5, S. 1141-1147Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019), Heft 1, S. 104-110Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-09-01), Heft 9, S. 2367-2374Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-10-01), Heft 10, S. 2524-2532Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), Heft 5, S. 573-580Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 38-44Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 45-53Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-07-01), Heft 7, S. 1414-1422Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019), Heft 1, S. 177-183Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-03-01), Heft 3, S. 616-624Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019), Heft 1, S. 111-119Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-06-01), Heft 6, S. 1264-1270Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 92-100Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 101-110Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 245-252Online academicJournalZugriff: