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- dark current 3 Treffer
- electric field enhancement (efe) 3 Treffer
- photodiodes 3 Treffer
- radiation effects 3 Treffer
- random telegraph signal (rts) 3 Treffer
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42 weitere Werte:
- annealing 2 Treffer
- cmos image sensors 2 Treffer
- leakage current 2 Treffer
- leakage currents 2 Treffer
- neutron 2 Treffer
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- active pixel sensor (aps) 1 Treffer
- active pixel sensors 1 Treffer
- arsenic 1 Treffer
- bulk defects 1 Treffer
- charge storage 1 Treffer
- cluster 1 Treffer
- dark current (dc) 1 Treffer
- dark current random telegraph signal (dc-rts) 1 Treffer
- dark current spectroscopy (dcs) 1 Treffer
- displacement damage dose 1 Treffer
- doping 1 Treffer
- dynamic random access memory (dram) 1 Treffer
- electron irradiation 1 Treffer
- gamma irradiation 1 Treffer
- gamma-ray 1 Treffer
- global shutter 1 Treffer
- hot pixels 1 Treffer
- image sensors 1 Treffer
- integrated circuits 1 Treffer
- interface states 1 Treffer
- junctions 1 Treffer
- monolithic active pixel sensor (maps) 1 Treffer
- oxide defects 1 Treffer
- phosphorus 1 Treffer
- proton 1 Treffer
- random access memory 1 Treffer
- rts 1 Treffer
- sensor arrays 1 Treffer
- silicon 1 Treffer
- synchronous dram (sdram) 1 Treffer
- temperature measurement 1 Treffer
- time measurement 1 Treffer
- total ionizing dose 1 Treffer
- variable junction leakage (vjl) 1 Treffer
- variable retention time (vrt) 1 Treffer
- x-ray irradiation 1 Treffer
5 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1241-1250Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020), Heft 1, S. 268-277Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020), Heft 1, S. 234-244Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-03-01), Heft 3, S. 616-624Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-12-01), Heft 6, S. 3085-3094Online academicJournalZugriff: