Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- dark current 4 Treffer
- photodiodes 4 Treffer
- cmos image sensor (cis) 3 Treffer
- displacement damage dose (ddd) 3 Treffer
- radiation 3 Treffer
-
45 weitere Werte:
- annealing 2 Treffer
- complementary metal oxide semiconductors 2 Treffer
- gamma rays 2 Treffer
- neutron irradiation 2 Treffer
- pinned photodiode (ppd) 2 Treffer
- random telegraph signal (rts) 2 Treffer
- active pixel sensor (aps) 1 Treffer
- active pixel sensors 1 Treffer
- arsenic 1 Treffer
- arsenic compounds 1 Treffer
- burst errors (telecommunications) 1 Treffer
- cluster 1 Treffer
- current fluctuations 1 Treffer
- dark currents (electric) 1 Treffer
- degradation 1 Treffer
- deuterium 1 Treffer
- deuterium plasma 1 Treffer
- dielectrics 1 Treffer
- displacement damage 1 Treffer
- doping 1 Treffer
- electron irradiation 1 Treffer
- electrons 1 Treffer
- equations 1 Treffer
- gamma radiation 1 Treffer
- gamma-ray effects 1 Treffer
- gamma-rays 1 Treffer
- hot pixels 1 Treffer
- image converters 1 Treffer
- integrated circuits 1 Treffer
- ionizing radiation dosage 1 Treffer
- irradiation 1 Treffer
- leakage 1 Treffer
- leakage current 1 Treffer
- leakage currents 1 Treffer
- microscopy 1 Treffer
- monolithic active pixel sensor (maps) 1 Treffer
- neutron 1 Treffer
- neutron radiation 1 Treffer
- neutron radiation effects 1 Treffer
- optical sensors 1 Treffer
- passivation 1 Treffer
- phosphorus 1 Treffer
- photoelectric devices 1 Treffer
- pixels 1 Treffer
- proton 1 Treffer
Sprache
6 Treffer
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-02-01), Heft 2, S. 268-277Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1241-1250Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-03-01), Heft 3, S. 616-624Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-06-01), Heft 6, S. 1264-1270Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-12-01), Heft 6, S. 3085-3094Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-03-01), Heft 3, S. 534-541Online academicJournalZugriff: