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Weniger Treffer
Gefunden in
Schlagwort
- optoelectronics 102 Treffer
- electrical and electronic engineering 73 Treffer
- electrical engineering 67 Treffer
- electronic, optical and magnetic materials 59 Treffer
- mosfet 53 Treffer
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45 weitere Werte:
- doping 43 Treffer
- law 37 Treffer
- law.invention 37 Treffer
- threshold voltage 37 Treffer
- field-effect transistor 36 Treffer
- transistor 33 Treffer
- chemistry 30 Treffer
- electronic engineering 21 Treffer
- chemistry.chemical_compound 20 Treffer
- cmos 20 Treffer
- voltage 19 Treffer
- electric field 17 Treffer
- gate oxide 16 Treffer
- condensed matter physics 15 Treffer
- equivalent series resistance 13 Treffer
- drain-induced barrier lowering 12 Treffer
- breakdown voltage 11 Treffer
- chemistry.chemical_element 11 Treffer
- degradation (geology) 11 Treffer
- impact ionization 11 Treffer
- substrate (electronics) 11 Treffer
- capacitance 10 Treffer
- reliability (semiconductor) 10 Treffer
- stress (mechanics) 10 Treffer
- analytical chemistry 9 Treffer
- channel length modulation 9 Treffer
- hardware_integratedcircuits 9 Treffer
- silicon on insulator 9 Treffer
- very-large-scale integration 9 Treffer
- communication channel 8 Treffer
- engineering 8 Treffer
- gallium arsenide 8 Treffer
- hardware_performanceandreliability 8 Treffer
- hot-carrier injection 8 Treffer
- ion implantation 8 Treffer
- negative-bias temperature instability 8 Treffer
- oxide 8 Treffer
- silicon 8 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 7 Treffer
- electron mobility 7 Treffer
- materials chemistry 7 Treffer
- nmos logic 7 Treffer
- thin-film transistor 7 Treffer
- cutoff frequency 6 Treffer
- degradation (telecommunications) 6 Treffer
Verlag
- institute of electrical and electronics engineers (ieee) 53 Treffer
- ieee 21 Treffer
- elsevier bv 9 Treffer
- ire 8 Treffer
- institution of engineering and technology (iet) 6 Treffer
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11 weitere Werte:
- iop publishing 6 Treffer
- informa uk limited 4 Treffer
- canadian science publishing 1 Treffer
- edp sciences 1 Treffer
- iee 1 Treffer
- inst. electr. eng. japan 1 Treffer
- korean physical society 1 Treffer
- spie 1 Treffer
- springer science and business media llc 1 Treffer
- the electrochemical society 1 Treffer
- zenodo 1 Treffer
Publikation
- ieee transactions on electron devices 29 Treffer
- ieee electron device letters 18 Treffer
- international journal of electronics 4 Treffer
- solid-state electronics 4 Treffer
- 1985 international electron devices meeting 3 Treffer
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45 weitere Werte:
- electronics letters 3 Treffer
- japanese journal of applied physics 3 Treffer
- 1984 international electron devices meeting 2 Treffer
- 1986 international electron devices meeting 2 Treffer
- ieee transactions on nuclear science 2 Treffer
- microelectronics reliability 2 Treffer
- 12th annual symposium on gallium arsenide integrated circuit (gaas ic) 1 Treffer
- 1987 international electron devices meeting 1 Treffer
- 1990 ieee sos/soi technology conference. proceedings 1 Treffer
- 1995 international symposium on vlsi technology, systems, and applications. proceedings of technical papers 1 Treffer
- 1997 21st international conference on microelectronics. proceedings 1 Treffer
- 2000 ieee international reliability physics symposium proceedings. 38th annual (cat. no.00ch37059) 1 Treffer
- 2001 ieee international reliability physics symposium proceedings. 39th annual (cat. no.00ch37167) 1 Treffer
- 2002 23rd international conference on microelectronics. proceedings (cat. no.02th8595) 1 Treffer
- 2008 5th international conference on electrical engineering/electronics, computer, telecommunications and information technology 1 Treffer
- 2008 international symposium on vlsi technology, systems and applications (vlsi-tsa) 1 Treffer
- 2017 international conference on nextgen electronic technologies: silicon to software (icnets2) 1 Treffer
- 24th international reliability physics symposium 1 Treffer
- 9th international seminar on power semiconductors (isps 2008) 1 Treffer
- applied physics a 1 Treffer
- canadian journal of physics 1 Treffer
- chinese physics b 1 Treffer
- electrochemical and solid-state letters 1 Treffer
- icmts 2001. proceedings of the 2001 international conference on microelectronic test structures (cat. no.01ch37153) 1 Treffer
- iee proceedings - circuits, devices and systems 1 Treffer
- iee proceedings i solid state and electron devices 1 Treffer
- ieee circuits and devices magazine 1 Treffer
- ieee international soi conference 1 Treffer
- ieee international soi conference soi-02 1 Treffer
- ieee journal of solid-state circuits 1 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems 1 Treffer
- ieee transactions on nanotechnology 1 Treffer
- international electron devices meeting. iedm technical digest 1 Treffer
- international technical digest on electron devices meeting 1 Treffer
- journal of semiconductors 1 Treffer
- journal of the korean physical society 1 Treffer
- le journal de physique colloques 1 Treffer
- micro & nano letters 1 Treffer
- microelectronic engineering 1 Treffer
- proceedings of ieee international electron devices meeting 1 Treffer
- proceedings of international conference on microelectronics 1 Treffer
- proceedings of the 13th international symposium on power semiconductor devices & ics. ipsd '01 (ieee cat. no.01ch37216) 1 Treffer
- proceedings. ieee international soi conference 1 Treffer
- semiconductor science and technology 1 Treffer
- spie proceedings 1 Treffer
119 Treffer
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In: Applied Physics A, Jg. 126 (2020-09-12)Online unknownZugriff:
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In: 2017 International Conference on Nextgen Electronic Technologies: Silicon to Software (ICNETS2), 2017-03-01Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 41 (1994-07-01), S. 1239-1248Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 46 (1999), S. 38-47Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 38 (1998-12-01), S. 1955-1961Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 45 (1998), S. 2489-2498Online unknownZugriff:
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In: Canadian Journal of Physics, Jg. 74 (1996-12-01), S. 167-171Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 43 (1996-07-01), S. 1114-1122Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 42 (1995), S. 1600-1604Online unknownZugriff:
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In: Solid-State Electronics, Jg. 37 (1994-12-01), S. 1961-1965Online unknownZugriff:
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In: Solid-State Electronics, Jg. 37 (1994), S. 77-82Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 41 (1994), S. 268-271Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 44 (1997), S. 1473-1482Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 22 (2001-05-01), S. 236-238Online unknownZugriff:
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In: International Journal of Electronics, Jg. 73 (1992-10-01), S. 703-710Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 39 (1992-06-01), S. 1469-1476Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 39 (1992-04-01), S. 982-989Online unknownZugriff:
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In: International Journal of Electronics, Jg. 71 (1991-08-01), S. 215-225Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 12 (1991-07-01), S. 375-378Online unknownZugriff:
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In: 2008 5th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, 2008-05-01Online unknownZugriff: