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In: Journal of Physics: Conference Series, Jg. 1550 (2020-05-01), S. 052022-52022Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 939 (2017-12-01), S. 012028-12028Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 10 (2005), S. 1-6Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 834 (2017-05-02), S. 012005-12005Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 675 (2016-02-05), S. 042043-42043Online unknownZugriff:
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Strain distribution analysis in Si/SiGe line structures for CMOS technology using Raman spectroscopyIn: Journal of Physics: Conference Series, Jg. 209 (2010-02-01), S. 012008-12008Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 1410 (2019-12-01), S. 012017-12017Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 762 (2016-10-01), S. 012022-12022Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 675 (2016-02-05), S. 042031-42031Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 619 (2015-06-17), S. 012023-12023Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 404 (2012-12-21), S. 012062-12062Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 1804 (2021-02-01), S. 012162-12162Online unknownZugriff:
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In: Journal of Physics: Conference Series, Jg. 660 (2015-12-10), S. 012037-12037Online unknownZugriff: