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Weniger Treffer
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Schlagwort
- cmos 792 Treffer
- business 563 Treffer
- business.industry 561 Treffer
- hardware_integratedcircuits 456 Treffer
- optoelectronics 426 Treffer
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45 weitere Werte:
- hardware_performanceandreliability 407 Treffer
- electrical and electronic engineering 282 Treffer
- hardware_logicdesign 235 Treffer
- mosfet 223 Treffer
- electronic, optical and magnetic materials 164 Treffer
- electronic circuit 133 Treffer
- chemistry 121 Treffer
- 02 engineering and technology 118 Treffer
- voltage 115 Treffer
- threshold voltage 113 Treffer
- electrical engineering 111 Treffer
- logic gate 109 Treffer
- hardware_general 101 Treffer
- chemistry.chemical_element 89 Treffer
- nmos logic 88 Treffer
- silicon on insulator 81 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 77 Treffer
- 01 natural sciences 76 Treffer
- integrated circuit 76 Treffer
- silicon 74 Treffer
- leakage (electronics) 72 Treffer
- pmos logic 70 Treffer
- 0103 physical sciences 69 Treffer
- condensed matter physics 64 Treffer
- 010302 applied physics 60 Treffer
- field-effect transistor 57 Treffer
- chemistry.chemical_compound 56 Treffer
- reliability (semiconductor) 53 Treffer
- 020208 electrical & electronic engineering 51 Treffer
- gate oxide 49 Treffer
- static random-access memory 48 Treffer
- hardware_memorystructures 46 Treffer
- semiconductor device modeling 45 Treffer
- capacitance 44 Treffer
- wafer 43 Treffer
- 0210 nano-technology 42 Treffer
- 021001 nanoscience & nanotechnology 42 Treffer
- amplifier 39 Treffer
- biasing 39 Treffer
- chip 39 Treffer
- computer science::hardware architecture 37 Treffer
- metal gate 36 Treffer
- 020206 networking & telecommunications 35 Treffer
- fabrication 35 Treffer
- power (physics) 35 Treffer
Verlag
- ieee 437 Treffer
- institute of electrical and electronics engineers (ieee) 166 Treffer
- elsevier bv 39 Treffer
- springer science and business media llc 21 Treffer
- spie 18 Treffer
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45 weitere Werte:
- institution of engineering and technology (iet) 14 Treffer
- iop publishing 13 Treffer
- hal ccsd 11 Treffer
- acm 7 Treffer
- wiley 7 Treffer
- elsevier 6 Treffer
- ire 6 Treffer
- springer berlin heidelberg 6 Treffer
- the electrochemical society 6 Treffer
- the japan society of applied physics 6 Treffer
- trans tech publications, ltd. 6 Treffer
- springer international publishing 5 Treffer
- springer netherlands 5 Treffer
- world scientific pub co pte lt 5 Treffer
- springer us 4 Treffer
- aip 3 Treffer
- american vacuum soc 3 Treffer
- cambridge university press 3 Treffer
- defense technical information center 3 Treffer
- ieee comput. soc 3 Treffer
- japan soc. appl. phys 3 Treffer
- springer singapore 3 Treffer
- springer vienna 3 Treffer
- the institute of electronics engineers of korea 3 Treffer
- acm press 2 Treffer
- aip publishing 2 Treffer
- cambridge university press (cup) 2 Treffer
- edp sciences 2 Treffer
- hindawi publishing corporation 2 Treffer
- ieee comput. soc. press 2 Treffer
- institute of electronics, information and communications engineers (ieice) 2 Treffer
- mdpi ag 2 Treffer
- the electromagnetics academy 2 Treffer
- aip publishing llc 1 Treffer
- allerton press 1 Treffer
- american institute of physics 1 Treffer
- american society of mechanical engineers 1 Treffer
- arxiv 1 Treffer
- asme international 1 Treffer
- asmedc 1 Treffer
- association for computing machinery, inc 1 Treffer
- carnegie mellon university 1 Treffer
- destech publications 1 Treffer
- elsevier ltd. 1 Treffer
- emerald 1 Treffer
Publikation
- ieee transactions on electron devices 58 Treffer
- ieee transactions on nuclear science 26 Treffer
- ieee electron device letters 23 Treffer
- spie proceedings 16 Treffer
- microelectronics reliability 14 Treffer
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45 weitere Werte:
- solid-state electronics 12 Treffer
- electronics letters 10 Treffer
- ieee journal of solid-state circuits 10 Treffer
- analog integrated circuits and signal processing 9 Treffer
- ieee transactions on device and materials reliability 8 Treffer
- ieee transactions on circuits and systems ii: express briefs 7 Treffer
- ecs transactions 6 Treffer
- journal of semiconductors 6 Treffer
- aeu - international journal of electronics and communications 5 Treffer
- aip conference proceedings 5 Treffer
- 2007 65th annual device research conference 4 Treffer
- 2008 international soc design conference 4 Treffer
- ieee sensors journal 4 Treffer
- ieee transactions on very large scale integration (vlsi) systems 4 Treffer
- ion implantation technology. 2002. proceedings of the 14th international conference on 4 Treffer
- 2007 ieee international reliability physics symposium proceedings. 45th annual 3 Treffer
- 2008 ieee international electron devices meeting 3 Treffer
- 2013 ieee international symposium on circuits and systems (iscas2013) 3 Treffer
- 2015 ieee international reliability physics symposium 3 Treffer
- 32nd european solid-state device research conference 3 Treffer
- advanced materials research 3 Treffer
- digest of technical papers. 2005 symposium on vlsi technology, 2005. 3 Treffer
- ieee internationalelectron devices meeting, 2005. iedm technical digest. 3 Treffer
- ieee transactions on biomedical circuits and systems 3 Treffer
- ieee transactions on circuits and systems i: regular papers 3 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems 3 Treffer
- ieee transactions on semiconductor manufacturing 3 Treffer
- international electron devices meeting 1999. technical digest (cat. no.99ch36318) 3 Treffer
- international electron devices meeting. technical digest (cat. no.01ch37224) 3 Treffer
- journal of circuits, systems and computers 3 Treffer
- jsts:journal of semiconductor technology and science 3 Treffer
- proceedings. ieee international soi conference 3 Treffer
- radecs 97. fourth european conference on radiation and its effects on components and systems (cat. no.97th8294) 3 Treffer
- silicon 3 Treffer
- 1985 international electron devices meeting 2 Treffer
- 1990 ieee sos/soi technology conference. proceedings 2 Treffer
- 1997 ieee international integrated reliability workshop final report (cat. no.97th8319) 2 Treffer
- 1998 international conference on ion implantation technology. proceedings (cat. no.98ex144) 2 Treffer
- 2001 6th international conference on solid-state and integrated circuit technology. proceedings (cat. no.01ex443) 2 Treffer
- 2001 international symposium on vlsi technology, systems, and applications. proceedings of technical papers (cat. no.01th8517) 2 Treffer
- 2004 ieee international reliability physics symposium. proceedings 2 Treffer
- 2005 international conference on simulation of semiconductor processes and devices 2 Treffer
- 2006 international workshop on nano cmos 2 Treffer
- 2007 14th ieee international conference on electronics, circuits and systems 2 Treffer
- 2007 50th midwest symposium on circuits and systems 2 Treffer
Sprache
904 Treffer
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In: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Jg. 7 (2021-12-01), S. 193-200Online unknownZugriff:
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In: IEEE Transactions on Circuits and Systems II: Express Briefs, Jg. 68 (2021-02-01), S. 562-567Online unknownZugriff:
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In: IEEE Microwave and Wireless Components Letters, Jg. 30 (2020-08-01), S. 798-801Online unknownZugriff:
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In: IET Circuits, Devices & Systems, Jg. 14 (2020-04-30), S. 555-561Online unknownZugriff:
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In: Frontiers in Neuroscience, Jg. 15 (2021-06-01)Online unknownZugriff:
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In: Microsystem Technologies, Jg. 25 (2019-03-29), S. 4163-4171Online unknownZugriff:
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In: Circuits, Systems, and Signal Processing, Jg. 38 (2019-01-07), S. 2910-2930Online unknownZugriff:
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In: Analog Integrated Circuits and Signal Processing, Jg. 99 (2019-03-12), S. 529-537Online unknownZugriff:
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In: Electronics, Jg. 10 (2021-11-26), S. 2931-2931Online unknownZugriff:
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In: Microelectronics Reliability, 2018-09-01, S. 965-968Online unknownZugriff:
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In: 2020 IEEE International Symposium on Circuits and Systems (ISCAS), 2020-10-01Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 82 (2018-03-01), S. 100-112Online unknownZugriff:
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In: Analog Integrated Circuits and Signal Processing, Jg. 94 (2017-11-06), S. 139-146Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 5 (2017-11-01), S. 466-472Online unknownZugriff:
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In: 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2019-10-14Online unknownZugriff:
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In: Analog Integrated Circuits and Signal Processing, Jg. 97 (2018-06-23), S. 39-47Online unknownZugriff:
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In: AEU - International Journal of Electronics and Communications, Jg. 137 (2021-07-01), S. 153824-153824Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021), S. 152-157Online unknownZugriff: