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18 weitere Werte:
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45 weitere Werte:
- optoelectronics 560 Treffer
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- solid-state electronics 54 Treffer
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45 weitere Werte:
- ieee electron device letters 23 Treffer
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- chinese physics b 8 Treffer
- radiation effects and defects in solids 8 Treffer
- journal of semiconductors 7 Treffer
- semiconductor science and technology 6 Treffer
- i.e.e.e. transactions on electron devices 5 Treffer
- ibm journal of research and development 5 Treffer
- materials science in semiconductor processing 5 Treffer
- siemens zeitschrift 5 Treffer
- electronics, new york 4 Treffer
- funkschau 4 Treffer
- microelectronics and reliability 4 Treffer
- solid state electronics 4 Treffer
- elektor, deutsche ausgabe 3 Treffer
- journal of the electrochemical society 3 Treffer
- dielectric materials & applications 2 Treffer
- electronic design 2 Treffer
- international journal of electrical & computer engineering (2088-8708) 2 Treffer
- newnes dictionary of electronics, newnes 2 Treffer
- physik in der schule 2 Treffer
- radiation effects & defects in solids 2 Treffer
- 電子情報通信学会技術研究報告 = ieice technical report : 信学技報 2 Treffer
- applied research and smart technology 1 Treffer
- electronic components & materials 1 Treffer
- electronics for guitarists 1 Treffer
- electro-optic technology application 1 Treffer
- journal of astronautic metrology and measurement 1 Treffer
- journal of beijing institute of machinery 1 Treffer
- journal of the korean institute of electrical and electronic material engineers 1 Treffer
- journal of the microelectronic engineering conference 1 Treffer
- modern applied physics 1 Treffer
- science technology and engineering 1 Treffer
- universidad catolica de cuenca ; repositorio institucional - ucacue 1 Treffer
- 전기전자재료학회논문지(j. korean inst. electr. electron. mater. eng.) 1 Treffer
- 光电技术应用 1 Treffer
- 北京信息科技大学学报:自然科学版 1 Treffer
- 宇航计测技术 1 Treffer
- 现代应用物理 1 Treffer
- 电子元件与材料 1 Treffer
- 科学技术与工程 1 Treffer
Sprache
1.195 Treffer
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In: IEEE Electron Device Letters, Jg. 43 (2022-09-01), Heft 9, S. 1531-1534Online academicJournalZugriff:
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In: 现代应用物理 / Modern Applied Physics, 2019, Heft 1, S. 59academicJournalZugriff:
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In: 전기전자재료학회논문지(J. Korean Inst. Electr. Electron. Mater. Eng.) / Journal of the Korean Institute of Electrical and Electronic Material Engineers, Jg. 27 (2014-03-01), Heft 3, S. 167-171academicJournalZugriff:
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In: 北京信息科技大学学报：自然科学版 / Journal of Beijing Institute of Machinery, Jg. 27 (2012), Heft 2, S. 92academicJournalZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!academicJournalZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!NachschlagewerkZugriff:
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In: Japanese journal of applied physics, Jg. 32 (1993), Heft 5B, S. 2521-2524academicJournalZugriff:
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In: Materials science in semiconductor processing, Jg. 13 (2010), Heft 5-6, S. 344-348academicJournalZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!NachschlagewerkZugriff:
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In: 2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA), 2021-08-01Online unknownZugriff:
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In: Microelectronic device technology III (Santa Clara CA, 22-23 September 1999), 1999, S. 94-101KonferenzZugriff:
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In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Jg. 467 (2020-03-01), S. 114-117Online unknownZugriff:
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In: Radiation Effects and Defects in Solids, Jg. 174 (2019-09-20), S. 859-872Online unknownSiehe Detailanzeige für VolltextZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), S. 1566-1573Online unknownZugriff:
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In: Radiation Effects and Defects in Solids, Jg. 173 (2018-07-22), S. 683-693Online unknownZugriff:
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In: International journal of electronics, Jg. 81 (1996), Heft 5, S. 501-516Online academicJournalZugriff:
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In: Superlattices and Microstructures, Jg. 122 (2018-10-01), S. 194-202Online unknownZugriff:
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In: Solid-state electronics, Jg. 37 (1994), Heft 2, S. 295-301academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 82 (2018-03-01), S. 130-135Online unknownZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), S. 539-544Online unknownZugriff:
