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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary mos technology 212 Treffer
- technologie mos complementaire 212 Treffer
- tecnologia mos complementario 212 Treffer
- circuits integres 201 Treffer
- integrated circuits 201 Treffer
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45 weitere Werte:
- conception. technologies. analyse fonctionnement. essais 199 Treffer
- design. technologies. operation analysis. testing 199 Treffer
- mosfet 101 Treffer
- transistor mosfet 101 Treffer
- circuits electriques, optiques et optoelectroniques 99 Treffer
- electric, optical and optoelectronic circuits 99 Treffer
- evaluation performance 89 Treffer
- performance evaluation 89 Treffer
- evaluacion prestacion 88 Treffer
- circuit properties 85 Treffer
- proprietes des circuits 85 Treffer
- circuits electroniques 83 Treffer
- electronic circuits 83 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 50 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 50 Treffer
- transistor 50 Treffer
- circuit integre 46 Treffer
- circuito integrado 46 Treffer
- integrated circuit 46 Treffer
- silicium 46 Treffer
- silicon 46 Treffer
- 8530t 45 Treffer
- silicio 42 Treffer
- physics 41 Treffer
- physique 41 Treffer
- seuil tension 38 Treffer
- umbral tension 38 Treffer
- voltage threshold 38 Treffer
- circuit design 35 Treffer
- circuits numeriques 35 Treffer
- conception circuit 35 Treffer
- digital circuits 35 Treffer
- diseno circuito 35 Treffer
- electronique faible puissance 35 Treffer
- low-power electronics 35 Treffer
- reliability 34 Treffer
- transistor effet champ 34 Treffer
- circuit integre cmos 33 Treffer
- cmos integrated circuits 33 Treffer
- condensed state physics 33 Treffer
- fiabilidad 33 Treffer
- fiabilite 33 Treffer
- physique de l'etat condense 33 Treffer
- damaging 32 Treffer
- deterioracion 32 Treffer
Publikation
- microelectronics and reliability 68 Treffer
- solid-state electronics 52 Treffer
- microelectronics journal 49 Treffer
- integration (amsterdam) 19 Treffer
- microelectronic engineering 18 Treffer
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44 weitere Werte:
- organic electronics (print) 14 Treffer
- insulating films on semiconductors 2013 5 Treffer
- journal of crystal growth 5 Treffer
- materials science & engineering. b, solid-state materials for advanced technology 5 Treffer
- selected extended papers from ulis 2012 conference 5 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 4 Treffer
- materials science in semiconductor processing 4 Treffer
- selected papers from the essderc 2011 conference 4 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 3 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 3 Treffer
- 2009 international electron devices and materials symposium (iedms) 3 Treffer
- reliability of electron devices, failure physics and analysis 3 Treffer
- european materials research society (e-mrs) 2001, spring meeting, symposium d: second international conference on silicon epitaxy and heterostructures, strasbourg, france, june 4-8th 2001 2 Treffer
- journal of non-crystalline solids 2 Treffer
- new aspects of si-and ge-based materials and devices 2 Treffer
- papers selected from the ultimate integration on silicon conference 2009, ulis 2009 2 Treffer
- physica. e, low-dimentional systems and nanostructures 2 Treffer
- selected full-length extended papers from the eurosoi 2009 conference 2 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 2 Treffer
- special issue: containing papers presented at the 2001 lawrence symposium on critical issues in epitaxy, january 3-6, 2001, scottsdale arizona 2 Treffer
- thin solid films 2 Treffer
- 14th international conference on molecular beam epitaxy (mbe-xiv), 3-8 september 2006, tokyo, japan 1 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 1 Treffer
- applied surface science 1 Treffer
- compound semiconductors and scintillators for radiation detection applications: a special tribute to the research of michael schieber 1 Treffer
- computing with future nanotechnology 1 Treffer
- current trends in nanotechnologies: from materials to systems, proceedings of symposium s, emrs spring meeting 2001, strasbourg, france, june 5-8, 2001 1 Treffer
- dielectrics in microelectronics (wodim 2004) 1 Treffer
- electrochemistry communications 1 Treffer
- fast wafer level reliability: methods and experiences 1 Treffer
- journal of parallel and distributed computing (print) 1 Treffer
- materials science & engineering c. biomimetic and supramolecular systems 1 Treffer
- mbe xiii, 2004: 13th international conference on molecular beam epitaxy, edinburgh, uk, 22-27 august 2004 1 Treffer
- negative-bias-temperature instability (nbti) in mos devices special sectio n 1 Treffer
- proceedings of the 2nd franco-italian symposium on sio2 and advanced dielectrics 1 Treffer
- proceedings of the 5th franco-italian symposium on sio2, advanced dielectrics and related devices, chamonix, mont blanc, france, june 21-23, 2004 1 Treffer
- progress in materials science 1 Treffer
- reliability physics of advanced electron devices 1 Treffer
- renewable & sustainable energy review 1 Treffer
- surface science reports 1 Treffer
- synthetic metals 1 Treffer
- the international symposium on ion implantation and other applications of ions and electrons - ion 2002, 10-13 june 2002, kazimierz dolny, poland 1 Treffer
- third international conference on low dimensional structures and devices, september 15-17, 1999, antalya, turkey 1 Treffer
- vacuum 1 Treffer
Sprache
249 Treffer
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 90-99academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 4, S. 510-531academicJournalZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Solid-state electronics, Jg. 62 (2011), Heft 1, S. 115-122academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 4, S. 592-599academicJournalZugriff:
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In: Reliability of electron devices, failure physics and analysis, Jg. 44 (2004), Heft 9-11, S. 1519-1522KonferenzZugriff:
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In: Solid-state electronics, Jg. 79 (2013), S. 79-86academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 12, S. 2357-2365academicJournalZugriff:
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In: Microelectronics journal, Jg. 42 (2011), Heft 11, S. 1269-1275academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 12, S. 897-905academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 4, S. 247-255academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 43 (2010), Heft 3, S. 251-257academicJournalZugriff:
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In: Organic electronics (Print), Jg. 13 (2012), Heft 12, S. 3045-3049academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 45 (2012), Heft 1, S. 33-45academicJournalZugriff:
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In: Organic electronics (Print), Jg. 10 (2009), Heft 7, S. 1217-1222academicJournalZugriff:
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In: The international symposium on ion implantation and other applications of ions and electrons - ION 2002, 10-13 June 2002, Kazimierz Dolny, Poland, Jg. 70 (2003), Heft 2-3, S. 323-329KonferenzZugriff:
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In: Organic electronics (Print), Jg. 14 (2013), Heft 1, S. 286-290academicJournalZugriff:
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In: Applied surface science, Jg. 257 (2011), Heft 20, S. 8413-8419academicJournalZugriff:
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In: Solid-state electronics, Jg. 63 (2011), Heft 1, S. 14-18academicJournalZugriff: