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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- circuits integres 101 Treffer
- integrated circuits 101 Treffer
- conception. technologies. analyse fonctionnement. essais 95 Treffer
- design. technologies. operation analysis. testing 95 Treffer
- complementary mos technology 87 Treffer
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45 weitere Werte:
- technologie mos complementaire 87 Treffer
- tecnologia mos complementario 87 Treffer
- evaluacion prestacion 58 Treffer
- evaluation performance 58 Treffer
- performance evaluation 58 Treffer
- circuit logique 57 Treffer
- circuito logico 57 Treffer
- logic circuit 57 Treffer
- circuit integre 49 Treffer
- circuito integrado 49 Treffer
- integrated circuit 49 Treffer
- electronique faible puissance 41 Treffer
- low-power electronics 41 Treffer
- transistor 41 Treffer
- mosfet 34 Treffer
- transistor mosfet 34 Treffer
- circuit logique cmos 32 Treffer
- cmos logic circuits 32 Treffer
- delay time 31 Treffer
- temps retard 31 Treffer
- tiempo retardo 31 Treffer
- circuit integre cmos 28 Treffer
- circuit numerique 28 Treffer
- circuito numerico 28 Treffer
- cmos integrated circuits 28 Treffer
- digital circuit 28 Treffer
- seuil tension 27 Treffer
- umbral tension 27 Treffer
- voltage threshold 27 Treffer
- circuits integres par fonction (dont memoires et processeurs) 24 Treffer
- integrated circuits by function (including memories and processors) 24 Treffer
- logic gate 24 Treffer
- porte logique 24 Treffer
- puerta logica 24 Treffer
- consommation energie electrique 23 Treffer
- power consumption 23 Treffer
- corriente escape 21 Treffer
- courant fuite 21 Treffer
- leakage current 21 Treffer
- field effect transistor 19 Treffer
- transistor efecto campo 19 Treffer
- transistor effet champ 19 Treffer
- baja tension 18 Treffer
- basse tension 18 Treffer
- low voltage 18 Treffer
Publikation
- i.e.e.e. transactions on electron devices 42 Treffer
- ieee transactions on very large scale integration (vlsi) systems 30 Treffer
- ieee journal of solid-state circuits 19 Treffer
- ieee electron device letters 11 Treffer
- ieee transactions on nanotechnology 8 Treffer
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11 weitere Werte:
- ieee transactions on semiconductor manufacturing 3 Treffer
- proceedings of the ieee 2 Treffer
- 2005 symposium on vlsi circuits 1 Treffer
- a future of integrated electronics: moving off the roadmap 1 Treffer
- esscirc 2006 1 Treffer
- ieee 2004 custom integrated circuits conference (cicc 2004) 1 Treffer
- ieee international solid-state circuits conference (isscc 2005), [san francisco, ca, usa, february 6-10, 2005] 1 Treffer
- nanoelectronics research for beyond cmos information processing 1 Treffer
- proceedings of the ieee 2004 custom integrated circuits conference (orlando, florida, october 3-6, 2004) 1 Treffer
- special issue on the 2006 ieee international solid-state circuits conference (isscc), multimedia for a mobile world, february 2006 1 Treffer
- the 33rd european solid-state circuits conference (esscirc 2007) 1 Treffer
Sprache
Geographischer Bezug
115 Treffer
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In: ESSCIRC 2006, Jg. 42 (2007), Heft 7, S. 1564-1573Online KonferenzZugriff:
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In: 2005 Symposium on VLSI Circuits, Jg. 41 (2006), Heft 4, S. 945-953Online KonferenzZugriff:
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In: IEEE 2004 Custom Integrated Circuits Conference (CICC 2004), Jg. 40 (2005), Heft 9, S. 1787-1796Online KonferenzZugriff:
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In: IEEE transactions on nanotechnology, Jg. 11 (2012), Heft 5, S. 1033-1039Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 59 (2012), Heft 4, S. 918-923Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 60 (2013), Heft 3, S. 972-977Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 57 (2010), Heft 1, S. 222-227Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 57 (2010), Heft 11, S. 3106-3114Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 20 (2012), Heft 5, S. 892-901Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 17 (2009), Heft 10, S. 1534-1545Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 60 (2013), Heft 1, S. 78-83Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 24 (2011), Heft 2, S. 273-279Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 19 (2011), Heft 6, S. 1023-1033Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 55 (2008), Heft 10, S. 2546-2553Online academicJournalZugriff:
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In: NANOELECTRONICS RESEARCH FOR BEYOND CMOS INFORMATION PROCESSING, Jg. 98 (2010), Heft 12, S. 2095-2110Online academicJournalZugriff:
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In: IEEE journal of solid-state circuits, Jg. 42 (2007), Heft 2, S. 441-450Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 56 (2009), Heft 9, S. 1991-1998Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 58 (2011), Heft 8, S. 2466-2472Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 19 (2011), Heft 4, S. 603-614Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 16 (2008), Heft 12, S. 1708-1712Online academicJournalZugriff: