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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- engineered materials, dielectrics and plasmas 6 Treffer
- silicon 6 Treffer
- computing and processing 3 Treffer
- leakage current 3 Treffer
- voltage 3 Treffer
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45 weitere Werte:
- charge carrier processes 2 Treffer
- degradation 2 Treffer
- kelvin 2 Treffer
- nanoscale devices 2 Treffer
- schottky barriers 2 Treffer
- semiconductor device modeling 2 Treffer
- silicides 2 Treffer
- temperature dependence 2 Treffer
- voltage control 2 Treffer
- algorithm design and analysis 1 Treffer
- bioengineering 1 Treffer
- capacitive sensors 1 Treffer
- character generation 1 Treffer
- circuit simulation 1 Treffer
- circuits 1 Treffer
- cmos logic circuits 1 Treffer
- cmos process 1 Treffer
- communication, networking and broadcast technologies 1 Treffer
- compressive stress 1 Treffer
- conductivity 1 Treffer
- contact resistance 1 Treffer
- electrodes 1 Treffer
- electron traps 1 Treffer
- eprom 1 Treffer
- fields, waves and electromagnetics 1 Treffer
- flash memory 1 Treffer
- fluctuations 1 Treffer
- general topics for engineers 1 Treffer
- high-k gate dielectrics 1 Treffer
- hot carriers 1 Treffer
- integrated circuit technology 1 Treffer
- laboratories 1 Treffer
- logic devices 1 Treffer
- low voltage 1 Treffer
- mass production 1 Treffer
- microscopy 1 Treffer
- mos devices 1 Treffer
- national electric code 1 Treffer
- paper technology 1 Treffer
- photonic band gap 1 Treffer
- photonics and electrooptics 1 Treffer
- power, energy and industry applications 1 Treffer
- quantum mechanics 1 Treffer
- reliability engineering 1 Treffer
- reservoirs 1 Treffer
Publikation
- 2006 8th international conference on solid-state and integrated circuit technology proceedings, solid-state and integrated circuit technology, 2006. icsict '06. 8th international conference on 2 Treffer
- 2002 ieee international conference on industrial technology, 2002. ieee icit '02., industrial technology, 2002. ieee icit '02. 2002 ieee international conference on, industrial technology 1 Treffer
- 2006 international caribbean conference on devices, circuits and systems, devices, circuits and systems, proceedings of the 6th international caribbean conference on 1 Treffer
- 2006 international conference on simulation of semiconductor processes and devices, simulation of semiconductor processes and devices, 2006 international conference on 1 Treffer
- 2006 international workshop on nano cmos, nano cmos, 2006 international workshop on 1 Treffer
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5 weitere Werte:
- 2008 45th acm/ieee design automation conference, design automation conference, 2008. dac 2008. 45th acm/ieee 1 Treffer
- 2008 9th international conference on solid-state and integrated-circuit technology, solid-state and integrated-circuit technology, 2008. icsict 2008. 9th international conference on 1 Treffer
- ieee internationalelectron devices meeting, 2005. iedm technical digest., electron devices meeting, 2005. iedm technical digest. ieee international, international electron devices meeting 2005 1 Treffer
- proceedings of 5th international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits, 1995., proceedings of the 1995 5th international symposium on the, physical and failure analysis of integrated circuits 1 Treffer
- proceedings of the 2002 international conference on microelectronic test structures, 2002. icmts 2002., microelectronic test structures, 2002. icmts 2002. proceedings of the 2002 international conference on, microelectronic test structures 1 Treffer
11 Treffer
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In: 2002 IEEE International Conference on Industrial Technology, 2002. IEEE ICIT, Jg. 2 (2002), S. 1219-1222KonferenzZugriff:
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In: 2006 International Workshop on Nano CMOS, 2006, S. 125KonferenzZugriff:
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In: 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings, 2006-10-01, S. 23KonferenzZugriff:
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In: 2006 International Conference on Simulation of Semiconductor Processes and Devices, 2006-09-01, S. 314KonferenzZugriff:
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In: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical, 2005, S. 538-538KonferenzZugriff:
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In: Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 1995, S. 91-95KonferenzZugriff:
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In: Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS, 2002, S. 139-144KonferenzZugriff:
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In: 2008 45th ACM/IEEE Design Automation Conference, 2008-06-01, S. 594Online KonferenzZugriff:
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In: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, 2008-10-01, S. 157KonferenzZugriff:
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In: 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings, 2006-10-01, S. 87KonferenzZugriff:
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In: 2006 International Caribbean Conference on Devices, Circuits and Systems, 2006-04-01, S. 3KonferenzZugriff: