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Weniger Treffer
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Schlagwort
- transistors 41 Treffer
- field effect transistor 32 Treffer
- transistor effet champ 32 Treffer
- transistor efecto campo 31 Treffer
- mos transistor 30 Treffer
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45 weitere Werte:
- transistor mos 30 Treffer
- lightly doped drain 20 Treffer
- drain peu dope 19 Treffer
- hot carrier 15 Treffer
- porteur chaud 15 Treffer
- portador caliente 14 Treffer
- estudio experimental 12 Treffer
- etude experimentale 12 Treffer
- experimental study 12 Treffer
- canal n 11 Treffer
- modeling 11 Treffer
- modelisation 11 Treffer
- modelizacion 11 Treffer
- n channel 11 Treffer
- estudio teorico 10 Treffer
- etude theorique 10 Treffer
- fiabilidad 10 Treffer
- fiabilite 10 Treffer
- reliability 10 Treffer
- seuil tension 10 Treffer
- theoretical study 10 Treffer
- voltage threshold 10 Treffer
- telecommunications 9 Treffer
- umbral tension 9 Treffer
- mosfet 8 Treffer
- optics 8 Treffer
- optique 8 Treffer
- transconductance 8 Treffer
- transistor mosfet 8 Treffer
- comparative study 7 Treffer
- complementary mos technology 7 Treffer
- dren poco dopado 7 Treffer
- estudio comparativo 7 Treffer
- etude comparative 7 Treffer
- fabrication microelectronique 7 Treffer
- microelectronic fabrication 7 Treffer
- silicio 7 Treffer
- silicium 7 Treffer
- silicon 7 Treffer
- technologie mos complementaire 7 Treffer
- tecnologia mos complementario 7 Treffer
- transconductancia 7 Treffer
- caracteristica electrica 6 Treffer
- caracteristique electrique 6 Treffer
- corte transverso 6 Treffer
Verlag
Publikation
- i.e.e.e. transactions on electron devices 12 Treffer
- ieee electron device letters 10 Treffer
- solid-state electronics 8 Treffer
- electronics letters 4 Treffer
- microelectronics and reliability 3 Treffer
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15 weitere Werte:
- 2002 ieee international reliability physics symposium proceedings (dallas tx, 7-11 april 2002) 2 Treffer
- active and passive electronic components 2 Treffer
- international journal of electronics 2 Treffer
- spie proceedings series 2 Treffer
- 2004 silicon nanoelectronics workshop, honolulu, hi, usa, 13-14 june 2004 1 Treffer
- ieee transactions on device and materials reliability 1 Treffer
- ieee transactions on nanotechnology 1 Treffer
- ieice transactions 1 Treffer
- ispsd '02 : 14th international symposium on power semiconductor devices & ics (santa fe nm, 4-7 june 2002) 1 Treffer
- japanese journal of applied physics 1 Treffer
- microelectronic engineering 1 Treffer
- physica. b, condensed matter 1 Treffer
- physics of semiconductor devices (delhi, 14-18 december 1999) 1 Treffer
- proceedings of the twelfth international conference on nonequilibrium carrier dynamics in semiconductors 1 Treffer
- smart structures, devices, and systems (melbourne, 16-18 december 2002) 1 Treffer
Sprache
52 Treffer
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In: IEEE electron device letters, Jg. 33 (2012), Heft 5, S. 682-684Online academicJournalZugriff:
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In: Active and passive electronic components, Jg. 26 (2003), Heft 4, S. 197-204Online academicJournalZugriff:
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In: Smart structures, devices, and systems (Melbourne, 16-18 December 2002), 2002, S. 316-324KonferenzZugriff:
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In: Proceedings of the Twelfth International Conference on Nonequilibrium Carrier Dynamics in Semiconductors, Jg. 314 (2002), Heft 1-4, S. 391-395KonferenzZugriff:
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In: Physics of semiconductor devices (Delhi, 14-18 December 1999), 2000, S. 594-597KonferenzZugriff:
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In: IEEE transactions on device and materials reliability, Jg. 1 (2001), Heft 3, S. 134-143Online academicJournalZugriff:
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In: International journal of electronics, Jg. 88 (2001), Heft 5, S. 507-516Online academicJournalZugriff:
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In: Microelectronic engineering, Jg. 45 (1999), Heft 1, S. 57-69academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 42 (1995), Heft 5, S. 957-962Online academicJournalZugriff:
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In: Solid-state electronics, Jg. 38 (1995), Heft 6, S. 1191-1196Online academicJournalZugriff:
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In: Solid-state electronics, Jg. 37 (1994), Heft 12, S. 1961-1965academicJournalZugriff:
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In: International journal of electronics, Jg. 76 (1994), Heft 1, S. 65-74Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 40 (1993), Heft 4, S. 773-781Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 39 (1992), Heft 6, S. 1469-1476Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 42 (1995), Heft 2, S. 362-365Online academicJournalZugriff:
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In: Active and passive electronic components, Jg. 20 (1998), Heft 3, S. 157-163Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 13 (1992), Heft 12, S. 654-657Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 16 (1995), Heft 6, S. 245-247Online academicJournalZugriff:
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In: IEICE transactions, Jg. 74 (1991), Heft 12, S. 4131-4135academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 38 (1991), Heft 11, S. 2460-2464Online academicJournalZugriff: