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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- standards 28 Treffer
- components, circuits, devices and systems 24 Treffer
- measurement uncertainty 22 Treffer
- power, energy and industry applications 21 Treffer
- frequency measurement 20 Treffer
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45 weitere Werte:
- thermal voltage converter (tvc) 20 Treffer
- uncertainty 18 Treffer
- calibration 15 Treffer
- electric potential 15 Treffer
- error 12 Treffer
- phase measurement 12 Treffer
- voltmeters 12 Treffer
- differential voltage measurement 10 Treffer
- fields, waves and electromagnetics 10 Treffer
- ac-dc transfer 9 Treffer
- switches 9 Treffer
- josephson arrays 8 Treffer
- radio frequency 8 Treffer
- voltage-frequency converters 8 Treffer
- wideband 7 Treffer
- alternating currents 6 Treffer
- metrology 6 Treffer
- resistors 6 Treffer
- ac-dc difference 5 Treffer
- detectors 5 Treffer
- harmonic analysis 5 Treffer
- impedance 5 Treffer
- measurement standards 5 Treffer
- programmable josephson voltage standard (pjvs) 5 Treffer
- ac-dc transfer difference 4 Treffer
- aluminum nitride 4 Treffer
- digital-analog conversion 4 Treffer
- electric potential measurement 4 Treffer
- finfets 4 Treffer
- heating systems 4 Treffer
- high voltage 4 Treffer
- iii-v semiconductor materials 4 Treffer
- josephson voltage standard 4 Treffer
- logic gates 4 Treffer
- measurement 4 Treffer
- measurement uncertainty (statistics) 4 Treffer
- radiation effects 4 Treffer
- robotics and control systems 4 Treffer
- signal synthesis 4 Treffer
- simulation methods & models 4 Treffer
- substrates 4 Treffer
- temperature dependence 4 Treffer
- temperature measurement 4 Treffer
- voltage standard 4 Treffer
- arrays 3 Treffer
Publikation
- ieee transactions on instrumentation & measurement 23 Treffer
- ieee transactions on instrumentation and measurement, instrumentation and measurement, ieee transactions on, ieee trans. instrum. meas. 13 Treffer
- 2020 conference on precision electromagnetic measurements (cpem), precision electromagnetic measurements (cpem), 2020 conference on 4 Treffer
- 2018 conference on precision electromagnetic measurements (cpem 2018), precision electromagnetic measurements (cpem 2018), 2018 conference on 2 Treffer
- ieee journal of solid-state circuits 2 Treffer
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8 weitere Werte:
- 1988. imtc-88. 5th ieee instrumentation and measurement technology conference, instrumentation and measurement technology conference, 1988. imtc-88. conference record., 5th ieee 1 Treffer
- 2018 17th international ural conference on ac electric drives (aced), ural conference on ac electric drives (aced), 2018 17th international ural conference on 1 Treffer
- 2018 ieee international solid-state circuits conference - (isscc), solid-state circuits conference - (isscc), 2018 ieee international 1 Treffer
- 2019 ieee asia-pacific microwave conference (apmc), asia-pacific microwave conference (apmc), 2019 ieee 1 Treffer
- 2021 ieee 9th workshop on advances in information, electronic and electrical engineering (aieee), advances in information, electronic and electrical engineering (aieee), 2021 ieee 9th workshop on 1 Treffer
- 2022 35th international conference on vlsi design and 2022 21st international conference on embedded systems (vlsid), vlsi design and 2022 21st international conference on embedded systems (vlsid), 2022 35th international conference on, vlsid 1 Treffer
- conference on precision electromagnetic measurements, precision electromagnetic measurements, 1990. cpem '90 digest., conference on 1 Treffer
- ieee journal of solid-state circuits, solid-state circuits, ieee journal of, ieee j. solid-state circuits 1 Treffer
Sprache
53 Treffer
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 70 (2021), S. 1-6Online academicJournalZugriff:
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A New Phase Difference Measurement System With Differential AC/Single-Ended DC Switching for One TVCIn: IEEE Transactions on Instrumentation and Measurement, Jg. 68 (2019-06-01), Heft 6, S. 2021-2026Online academicJournalZugriff:
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In: 2019 IEEE Asia-Pacific Microwave Conference (APMC), 2019-12-01, S. 1628-1630KonferenzZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 54 (2019), Heft 1, S. 210-216Online academicJournalZugriff:
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In: 2018 IEEE International Solid-State Circuits Conference - (ISSCC), 2018-02-01, S. 196-198KonferenzZugriff:
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In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 2018-07-01, S. 1-2KonferenzZugriff:
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In: 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID), 2022-02-01, S. 44-49KonferenzZugriff:
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In: 2021 IEEE 9th Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE), 2021-11-25, S. 1-6KonferenzZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 70 (2021), S. 1-9Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 68 (2019-06-01), Heft 6, S. 1921-1926Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 68 (2019-05-01), Heft 5, S. 1515-1521Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 58 (2009-04-01), Heft 4, S. 844-847Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 60 (2011-07-01), Heft 7, S. 2178-2183Online academicJournalZugriff:
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In: 2018 17th International Ural Conference on AC Electric Drives (ACED), 2018-03-01, S. 1-5KonferenzZugriff:
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In: 2020 Conference on Precision Electromagnetic Measurements (CPEM), 2020-08-01, S. 1-2KonferenzZugriff:
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In: 2020 Conference on Precision Electromagnetic Measurements (CPEM), 2020-08-01, S. 1-2KonferenzZugriff:
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In: 2020 Conference on Precision Electromagnetic Measurements (CPEM), 2020-08-01, S. 1-2KonferenzZugriff:
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In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 2018-07-01, S. 1-2KonferenzZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 72 (2023), S. 1-7Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 58 (2009-04-01), Heft 4, S. 761-767Online academicJournalZugriff: