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In: Proc. of 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'11) ; 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'11) ; https://hal.science/hal-00652374 ; 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'11), Oct 2011, Hong Kong, China. pp.380-385, ⟨10.1109/VLSISoC.2011.6081614⟩, 2011KonferenzZugriff:
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In: Proc. of 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'11) ; 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'11) ; https://hal.archives-ouvertes.fr/hal-00652374 ; 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'11), Oct 2011, Hong Kong, China. pp.380-385, ⟨10.1109/VLSISoC.2011.6081614⟩, 2011KonferenzZugriff: