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  1. Adam, Pierre ; Bertolino, Pascal ; et al.
    In: International Display Research Conference ; https://hal.science/hal-00177276 ; International Display Research Conference, Sep 2006, Kent, Ohio, United States. pp.CD, 2006
    Online Konferenz
  2. Adam, Pierre ; Bertolino, Pascal ; et al.
    In: International Display Research Conference ; https://hal.archives-ouvertes.fr/hal-00177276 ; International Display Research Conference, Sep 2006, Kent, Ohio, United States. pp.CD, 2006
    Online Konferenz
  3. Tourancheau, Sylvain ; Wang, Kun ; et al.
    In: Proceedings of the SPIE Stereoscopic Displays and Applications XXIII ; SPIE Stereoscopic Displays and Applications XXIII ; https://hal.science/hal-00665983 ; SPIE Stereoscopic Displays and Applications XXIII, Jan 2012, San franscisco, United States. pp.1-6, 2012
    Online Konferenz
  4. Tourancheau, Sylvain ; Wang, Kun ; et al.
    In: Proceedings of the SPIE Stereoscopic Displays and Applications XXIII ; SPIE Stereoscopic Displays and Applications XXIII ; https://hal.archives-ouvertes.fr/hal-00665983 ; SPIE Stereoscopic Displays and Applications XXIII, Jan 2012, San franscisco, United States. pp.1-6, 2012
    Online Konferenz
  5. Tourancheau, Sylvain ; Le Callet, Patrick ; et al.
    In: Proceedings of SPIE Conference Human Vision and Electronic Imaging XIV. ; Human Vision and Electronic Imaging XIV. ; https://hal.science/hal-00360273 ; Human Vision and Electronic Imaging XIV., Jan 2009, San Jose, CA, United States. pp.7240-51, 2009
    Online Konferenz
  6. Tourancheau, Sylvain ; Le Callet, Patrick ; et al.
    In: Proceedings of SPIE Conference Human Vision and Electronic Imaging XIV. ; Human Vision and Electronic Imaging XIV. ; https://hal.archives-ouvertes.fr/hal-00360273 ; Human Vision and Electronic Imaging XIV., Jan 2009, San Jose, CA, United States. pp.7240-51, 2009
    Online Konferenz
  7. Tourancheau, Sylvain ; Le Callet, Patrick ; et al.
    In: Proceedings of the IEEE International Conference on Image Processing 2007. ICIP 2007. ; IEEE International Conference on Image Processing 2007. ICIP 2007. ; https://hal.science/hal-00252407 ; IEEE International Conference on Image Processing 2007. ICIP 2007., Sep 2007, San Antonio, TX, United States. pp.441-444, ⟨10.1109/ICIP.2007.4379341⟩, 2007
    Online Konferenz
  8. Tourancheau, Sylvain ; Le Callet, Patrick ; et al.
    In: Proceedings of the Third International Workshop on Video Processing and Quality Metrics for Consumer Electronics ; Third International Workshop on Video Processing and Quality Metrics for Consumer Electronics, VPQM'07 ; https://hal.science/hal-00256047, 2007
    Online Konferenz
  9. Tourancheau, Sylvain ; Le Callet, Patrick ; et al.
    In: Proceedings of the IEEE International Conference on Image Processing 2007. ICIP 2007. ; IEEE International Conference on Image Processing 2007. ICIP 2007. ; https://hal.archives-ouvertes.fr/hal-00252407 ; IEEE International Conference on Image Processing 2007. ICIP 2007., Sep 2007, San Antonio, TX, United States. pp.441-444, ⟨10.1109/ICIP.2007.4379341⟩, 2007
    Online Konferenz
  10. Tourancheau, Sylvain ; Le Callet, Patrick ; et al.
    In: Proceedings of the Third International Workshop on Video Processing and Quality Metrics for Consumer Electronics ; Third International Workshop on Video Processing and Quality Metrics for Consumer Electronics, VPQM'07 ; https://hal.archives-ouvertes.fr/hal-00256047, 2007
    Online Konferenz
  11. Tourancheau, Sylvain ; Andrén, Borje ; et al.
    In: SID Symposium Digest of Technical Papers ; SID International Symposium, Seminar and Exhibition ; https://hal.science/hal-00368690, 2009
    Online Konferenz
  12. Tourancheau, Sylvain ; Andrén, Borje ; et al.
    In: SID Symposium Digest of Technical Papers ; SID International Symposium, Seminar and Exhibition ; https://hal.archives-ouvertes.fr/hal-00368690, 2009
    Online Konferenz
  13. Tourancheau, Sylvain ; Brunnström, Kjell ; et al.
    In: SID Symposium Digest of Technical Papers ; SID International Symposium, Seminar and Exhibition ; https://hal.science/hal-00270440, 2008
    Online Konferenz
  14. Tourancheau, Sylvain ; Brunnström, Kjell ; et al.
    In: SID Symposium Digest of Technical Papers ; SID International Symposium, Seminar and Exhibition ; https://hal.archives-ouvertes.fr/hal-00270440, 2008
    Online Konferenz
  15. Tourancheau, Sylvain ; Le Callet, Patrick ; et al.
    In: Hyper Article en Ligne - Sciences de l'Homme et de la Société ; Proceedings of the IEEE International Conference on Image Processing 2007. ICIP 2007. ; IEEE International Conference on Image Processing 2007. ICIP 2007. ; IEEE International Conference on Image Processing 2007. ICIP 2007., Sep 2007, San Antonio, TX, United States. pp.441-444, ⟨10.1109/ICIP.2007.4379341⟩, 2007
    Online Konferenz
  16. Tourancheau, Sylvain ; Le Callet, Patrick ; et al.
    In: Hyper Article en Ligne - Sciences de l'Homme et de la Société ; Proceedings of the Third International Workshop on Video Processing and Quality Metrics for Consumer Electronics ; Third International Workshop on Video Processing and Quality Metrics for Consumer Electronics, VPQM'07, 2007
    Online Konferenz
  17. Thuy Ngo, Xuan ; Bhasin, Shivam ; et al.
    In: IEEE International Symposium on Hardware Oriented Security and Trust (HOST) 2015 ; https://hal.archives-ouvertes.fr/hal-01240228 ; IEEE International Symposium on Hardware Oriented Security and Trust (HOST) 2015, May 2015, McLean, United States. ⟨10.1109/HST.2015.7140242⟩ ; http://www.hostsymposium.org/, 2015
    Online Konferenz
  18. United States. Government Accountability Office.
    2012
    report
  19. Friedmann, Edwin ; Poli, Jean-Philippe ; et al.
    In: Proceedings of 2020 IEEE 32nd International Conference on Tools with Artificial Intelligence (ICTAI) ; ICTAI 2020 - IEEE 32nd International Conference on Tools with Artificial Intelligence ; https://cea.hal.science/cea-04316074 ; ICTAI 2020 - IEEE 32nd International Conference on Tools with Artificial Intelligence, Nov 2020, Baltimore, United States. pp.917-922, ⟨10.1109/ICTAI50040.2020.00143⟩ ; https://ieeexplore.ieee.org/document/9288347, 2020
    Online Konferenz
  20. Friedmann, Edwin ; Poli, Jean-Philippe ; et al.
    In: Proceedings of 2020 IEEE 32nd International Conference on Tools with Artificial Intelligence (ICTAI) ; ICTAI 2020 - IEEE 32nd International Conference on Tools with Artificial Intelligence ; https://cea.hal.science/cea-04316074 ; ICTAI 2020 - IEEE 32nd International Conference on Tools with Artificial Intelligence, Nov 2020, Baltimore, United States. pp.917-922, ⟨10.1109/ICTAI50040.2020.00143⟩ ; https://ieeexplore.ieee.org/document/9288347, 2020
    Online Konferenz
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