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In: SANER 2021 - 28th IEEE International Conference on Software Analysis, Evolution and Reengineering ; https://hal.science/hal-03447628 ; SANER 2021 - 28th IEEE International Conference on Software Analysis, 2021Online KonferenzZugriff:
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In: SANER 2021 - 28th IEEE International Conference on Software Analysis, Evolution and Reengineering ; https://hal.science/hal-03447628 ; SANER 2021 - 28th IEEE International Conference on Software Analysis, 2021Online KonferenzZugriff:
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In: SANER 2021 - 28th IEEE International Conference on Software Analysis, Evolution and Reengineering ; https://hal.archives-ouvertes.fr/hal-03447628 ; SANER 2021 - 28th IEEE International Conference on Software Analysis, 2021Online KonferenzZugriff:
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In: SANER 2021 - 28th IEEE International Conference on Software Analysis, Evolution and Reengineering ; https://hal.science/hal-03447628 ; SANER 2021 - 28th IEEE International Conference on Software Analysis, 2021Online KonferenzZugriff:
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In: International Conference on Malicious and Unwanted Software ; https://inria.hal.science/inria-00330021 ; International Conference on Malicious and Unwanted Software, Fernando C. Colon Osorio, Oct 2008, Alexendria VA, United States, 2008Online KonferenzZugriff:
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In: International Conference on Malicious and Unwanted Software ; https://hal.inria.fr/inria-00330021 ; International Conference on Malicious and Unwanted Software, Fernando C. Colon Osorio, Oct 2008, Alexendria VA, United States, 2008Online KonferenzZugriff:
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In: International Conference on Malicious and Unwanted Software ; https://inria.hal.science/inria-00330021 ; International Conference on Malicious and Unwanted Software, Fernando C. Colon Osorio, Oct 2008, Alexendria VA, United States, 2008Online KonferenzZugriff:
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In: Proceedings of the IEEE International High-Level Validation and Test Workshop (HLDVT'00), ; IEEE International High-Level Validation and Test Workshop (HLDVT'00) ; https://hal.science/hal-00184805 ; IEEE International High-Level Validation and Test Workshop (HLDVT'00), 2000, Berkeley, United States. pp. 15-20, ⟨10.1109/HLDVT.2000.889553⟩, 2000KonferenzZugriff:
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In: Proceedings of the IEEE International High-Level Validation and Test Workshop (HLDVT'00), ; IEEE International High-Level Validation and Test Workshop (HLDVT'00) ; https://hal.archives-ouvertes.fr/hal-00184805 ; IEEE International High-Level Validation and Test Workshop (HLDVT'00), 2000, Berkeley, United States. pp. 15-20, ⟨10.1109/HLDVT.2000.889553⟩, 2000KonferenzZugriff: