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  1. Ducros, Nicolas ; Lorente Mur, A ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342766 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.619-623, ⟨10.1109/ISBI45749.2020.9098390⟩, 2020
    Online Konferenz
  2. Lorente Mur, Antonio ; Peyrin, Françoise ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342749 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.1651-1654, ⟨10.1109/ISBI45749.2020.9098327⟩, 2020
    Online Konferenz
  3. Ducros, Nicolas ; Lorente Mur, A ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342766 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.619-623, ⟨10.1109/ISBI45749.2020.9098390⟩, 2020
    Online Konferenz
  4. Lorente Mur, Antonio ; Peyrin, Françoise ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342749 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.1651-1654, ⟨10.1109/ISBI45749.2020.9098327⟩, 2020
    Online Konferenz
  5. Ducros, Nicolas ; Lorente Mur, A ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342766 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.619-623, ⟨10.1109/ISBI45749.2020.9098390⟩, 2020
    Online Konferenz
  6. Lorente Mur, Antonio ; Peyrin, Françoise ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342749 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.1651-1654, ⟨10.1109/ISBI45749.2020.9098327⟩, 2020
    Online Konferenz
  7. Lorente Mur, Antonio ; Peyrin, Françoise ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342749 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.1651-1654, ⟨10.1109/ISBI45749.2020.9098327⟩, 2020
    Online Konferenz
  8. Ducros, Nicolas ; Lorente Mur, A ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342766 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.619-623, ⟨10.1109/ISBI45749.2020.9098390⟩, 2020
    Online Konferenz
  9. Lorente Mur, Antonio ; Peyrin, Françoise ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342749 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.1651-1654, ⟨10.1109/ISBI45749.2020.9098327⟩, 2020
    Online Konferenz
  10. Ducros, Nicolas ; Lorente Mur, A ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342766 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.619-623, ⟨10.1109/ISBI45749.2020.9098390⟩, 2020
    Online Konferenz
  11. Lorente Mur, Antonio ; Peyrin, Françoise ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342749 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.1651-1654, ⟨10.1109/ISBI45749.2020.9098327⟩, 2020
    Online Konferenz
  12. Lorente Mur, Antonio ; PEYRIN, Françoise ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.archives-ouvertes.fr/hal-02342749 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.1651-1654, ⟨10.1109/ISBI45749.2020.9098327⟩, 2020
    Online Konferenz
  13. Ducros, Nicolas ; Lorente Mur, A ; et al.
    In: 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) ; https://hal.science/hal-02342766 ; 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI), Apr 2020, Iowa City, United States. pp.619-623, ⟨10.1109/ISBI45749.2020.9098390⟩, 2020
    Online Konferenz
  14. Kyranaki, Nikoleta ; Farha, Cynthia ; et al.
    In: 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC) ; https://hal.science/hal-03874724 ; 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC), Jun 2022, Philadelphia, United States. pp.0239-0239, ⟨10.1109/PVSC48317.2022.9938766⟩, 2022
    Konferenz
  15. Kyranaki, Nikoleta ; Farha, Cynthia ; et al.
    In: 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC) ; https://hal.science/hal-03874724 ; 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC), Jun 2022, Philadelphia, United States. pp.0239-0239, ⟨10.1109/PVSC48317.2022.9938766⟩, 2022
    Konferenz
  16. Kyranaki, Nikoleta ; Farha, Cynthia ; et al.
    In: 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC) ; https://hal.science/hal-03874724 ; 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC), Jun 2022, Philadelphia, United States. pp.0239-0239, ⟨10.1109/PVSC48317.2022.9938766⟩, 2022
    Konferenz
  17. Kyranaki, Nikoleta ; Farha, Cynthia ; et al.
    In: 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC) ; https://hal.science/hal-03874724 ; 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC), Jun 2022, Philadelphia, United States. pp.0239-0239, ⟨10.1109/PVSC48317.2022.9938766⟩, 2022
    Konferenz
  18. Riou, M. ; Araujo, F. Abreu ; et al.
    In: 2017 IEEE International Electron Devices Meeting (IEDM) ; https://hal.science/hal-01826841 ; 2017 IEEE International Electron Devices Meeting (IEDM), Dec 2017, San Francisco, United States. ⟨10.1109/IEDM.2017.8268505⟩, 2017
    Online Konferenz
  19. Riou, M. ; Araujo, F. Abreu ; et al.
    In: 2017 IEEE International Electron Devices Meeting (IEDM) ; https://hal.science/hal-01826841 ; 2017 IEEE International Electron Devices Meeting (IEDM), Dec 2017, San Francisco, United States. ⟨10.1109/IEDM.2017.8268505⟩, 2017
    Online Konferenz
  20. Riou, M. ; Araujo, F. Abreu ; et al.
    In: 2017 IEEE International Electron Devices Meeting (IEDM) ; https://hal.science/hal-01826841 ; 2017 IEEE International Electron Devices Meeting (IEDM), Dec 2017, San Francisco, United States. ⟨10.1109/IEDM.2017.8268505⟩, 2017
    Online Konferenz
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