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In: IEEE International Symposium on Circuits and Systems (ISCAS 2023) ; https://hal.science/hal-04171224 ; IEEE International Symposium on Circuits and Systems (ISCAS 2023), May 2023, Monterey, 2023Online KonferenzZugriff:
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In: 2023 IEEE International Symposium on Circuits and Systems (ISCAS) ; IEEE International Symposium on Circuits and Systems (ISCAS 2023) ; https://hal.science/hal-04171210 ; IEEE International Symposium on Circuits and Systems (ISCAS 2023), May 2023, Monterey (CA), United States. ⟨10.1109/ISCAS46773.2023.10181964⟩ ; IEEELink, 2023Online KonferenzZugriff:
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In: IEEE Transactions on Vehicular Technology, Jg. 55 (2006-05-01), Heft 3, S. 917-923Online academicJournalZugriff:
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In: VTS: VLSI Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00803453 ; VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩, 2012KonferenzZugriff:
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In: 61st IEEE MTT-S International Microwave Symposium, IMS 2013 ; https://hal.science/hal-00944030 ; 61st IEEE MTT-S International Microwave Symposium, 2013KonferenzZugriff: