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In: Plus Company Updates, 2024-05-10ZeitungsartikelZugriff:
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In: Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 1997, S. 103-108KonferenzZugriff:
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In: Proceedings. 24th EUROMICRO Conference (Cat. No.98EX204), Euromicro Conference,, Jg. 2 (1998), S. 787-793KonferenzZugriff:
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In: Micromachines, Jg. 14 (2023-05-01), Heft 5Online academicJournalZugriff:
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In: International Electron Devices Meeting. Technical Digest, 1996, S. 889-892KonferenzZugriff:
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In: 1996 IEEE International Symposium on Circuits and Systems (ISCAS), Jg. 4 (1996), S. 300-303KonferenzZugriff:
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In: Proceedings of Technical Papers. International Symposium on VLSI Technology, Systems, and Applications, 1997, S. 45-49KonferenzZugriff:
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