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- cmos integrated circuits 1.370 Treffer
- complementary metal oxide semiconductors 1.300 Treffer
- cmos technology 507 Treffer
- cmos analogue integrated circuits 490 Treffer
- low-power electronics 396 Treffer
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45 weitere Werte:
- size 0.18 mum 387 Treffer
- cmos process 355 Treffer
- size 65 nm 267 Treffer
- power consumption 257 Treffer
- integrated circuit design 247 Treffer
- electric potential 240 Treffer
- operational amplifiers 220 Treffer
- digital electronics 201 Treffer
- energy consumption 191 Treffer
- voltage-controlled oscillators 170 Treffer
- bandwidths 168 Treffer
- capacitors 164 Treffer
- electronic amplifiers 164 Treffer
- voltage 1.2 v 164 Treffer
- uhf integrated circuits 163 Treffer
- transistors 160 Treffer
- low noise amplifiers 159 Treffer
- analogue-digital conversion 158 Treffer
- cmos digital integrated circuits 154 Treffer
- integrated circuits 139 Treffer
- phase noise 139 Treffer
- power amplifiers 128 Treffer
- electric oscillators 123 Treffer
- cmos image sensors 122 Treffer
- voltage 1.8 v 122 Treffer
- cmos 116 Treffer
- silicon 116 Treffer
- size 0.13 mum 116 Treffer
- mosfet 114 Treffer
- field effect mmic 108 Treffer
- size 90 nm 104 Treffer
- cmos logic circuits 102 Treffer
- si 96 Treffer
- frequency dividers 92 Treffer
- calibration 91 Treffer
- size 0.35 mum 91 Treffer
- time-digital conversion 91 Treffer
- radio frequency 88 Treffer
- clocks 87 Treffer
- detectors 87 Treffer
- electric power consumption 84 Treffer
- size 180 nm 84 Treffer
- size 28 nm 83 Treffer
- logic circuits 80 Treffer
- signal-to-noise ratio 80 Treffer
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Geographischer Bezug
4.577 Treffer
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-10-01), Heft 19, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-08-01), Heft 15, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 60 (2024-05-01), Heft 9, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 60 (2024-03-01), Heft 5, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-10-15), Heft 20, S. 1-4Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 60 (2024-03-15), Heft 6, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-11-12), Heft 23, S. 1239-1241Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-12-01), Heft 23, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 57 (2021-07-01), Heft 14, S. 545-547Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-08-15), Heft 16, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-08-01), Heft 15, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-09-01), Heft 17, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-07-15), Heft 14, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-07-09), Heft 14, S. 696-698Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-11-26), Heft 24, S. 1301-1303Online academicJournalZugriff:
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Radio frequency reliability studies of CMOS RF integrated circuits for ultra-thin flexible packages.In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-03-17), Heft 6, S. 280-282Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-03-05), Heft 5, S. 232-234Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-06-01), Heft 11, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 58 (2022-03-15), Heft 6, S. 228-230Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-05-01), Heft 9, S. 1-4Online academicJournalZugriff: