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- complementary metal oxide semiconductors 50 Treffer
- delays 30 Treffer
- capacitors 28 Treffer
- analog-to-digital converters 25 Treffer
- energy consumption 25 Treffer
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45 weitere Werte:
- low power 24 Treffer
- jitter 23 Treffer
- transistors 22 Treffer
- cmos integrated circuits 18 Treffer
- logic gates 18 Treffer
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- phase locked loops 16 Treffer
- successive approximation analog-to-digital converters 16 Treffer
- computer architecture 15 Treffer
- calibration 14 Treffer
- bandwidth 13 Treffer
- electric power consumption 13 Treffer
- logic circuits 13 Treffer
- latches 12 Treffer
- signal-to-noise ratio 12 Treffer
- switches 12 Treffer
- capacitance 11 Treffer
- delay lines 11 Treffer
- integrated circuits 11 Treffer
- oscillators 11 Treffer
- receivers 11 Treffer
- detectors 10 Treffer
- modulation 10 Treffer
- noise 10 Treffer
- phase-locked loops 10 Treffer
- timing 10 Treffer
- delay 9 Treffer
- bandwidths 8 Treffer
- comparator circuits 8 Treffer
- phase noise 8 Treffer
- radiation detectors 8 Treffer
- registers 8 Treffer
- transmitters 8 Treffer
- transmitters (communication) 8 Treffer
- analog-to-digital converter (adc) 7 Treffer
- clocks & watches 7 Treffer
- decision feedback equalizers 7 Treffer
- generators 7 Treffer
- inverters 7 Treffer
- voltage-controlled oscillators 7 Treffer
- digital electronics 6 Treffer
- frequency conversion 6 Treffer
- internet of things 6 Treffer
- linearity 6 Treffer
- phase detectors 6 Treffer
Publikation
- ieee journal of solid-state circuits 40 Treffer
- ieee transactions on circuits & systems. part ii: express briefs 30 Treffer
- ieee transactions on circuits & systems. part i: regular papers 26 Treffer
- ieee transactions on very large scale integration (vlsi) systems 25 Treffer
- ieee transactions on microwave theory & techniques 4 Treffer
- 5 weitere Werte:
Sprache
137 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-06-01), Heft 6, S. 2979-2985Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part I: Regular Papers, Jg. 69 (2022-10-01), Heft 10, S. 3989-3999Online serialPeriodicalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part II: Express Briefs, Jg. 69 (2022-09-01), Heft 9, S. 3714-3718Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 57 (2022-06-01), Heft 6, S. 1700-1711Online academicJournalZugriff:
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In: IEEE Transactions on Applied Superconductivity, Jg. 30 (2020-10-01), Heft 7, S. 1-6Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 55 (2020-12-01), Heft 12, S. 3308-3321Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part II: Express Briefs, Jg. 69 (2022-03-01), Heft 3, S. 874-878Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-06-10), Heft 3, S. 1269-1277Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 29 (2021-12-01), Heft 12, S. 2098-2109Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part II: Express Briefs, Jg. 68 (2021-10-01), Heft 10, S. 3194-3198Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part I: Regular Papers, Jg. 67 (2020-11-01), Heft 11, S. 3718-3727Online serialPeriodicalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 54 (2019-08-01), Heft 8, S. 2163-2174Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 23 (2015-02-01), Heft 2, S. 356-368Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 52 (2017-12-01), Heft 12, S. 3204-3218Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017), Heft 1, S. 211-216Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 51 (2016), Heft 1, S. 240-248Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 23 (2015-03-01), Heft 3, S. 557-566Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part II: Express Briefs, Jg. 61 (2014-08-01), Heft 8, S. 584-588Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-05-01), Heft 5, S. 1212-1217Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 52 (2017-07-01), Heft 7, S. 1739-1752Online academicJournalZugriff: