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- logic gates 27 Treffer
- metal oxide semiconductor field-effect transistors 27 Treffer
- drain-induced barrier lowering (dibl) 26 Treffer
- mosfet 22 Treffer
- channel length modulation (clm) 21 Treffer
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45 weitere Werte:
- field-effect transistors 19 Treffer
- capacitance 17 Treffer
- complementary metal oxide semiconductors 13 Treffer
- velocity saturation 13 Treffer
- performance evaluation 12 Treffer
- semiconductors 11 Treffer
- silicon 11 Treffer
- transconductance (gm) 11 Treffer
- 2-d electron gas (2-deg) 10 Treffer
- analog circuits 10 Treffer
- channel-length modulation (clm) 10 Treffer
- electric capacity 10 Treffer
- electric potential 10 Treffer
- electric resistance 10 Treffer
- electrical and electronic engineering 10 Treffer
- electronic, optical and magnetic materials 10 Treffer
- drain conductance (gds) 9 Treffer
- early voltage (vea) 9 Treffer
- parameter extraction 9 Treffer
- self-heating 9 Treffer
- business 8 Treffer
- channel length modulation 8 Treffer
- gallium nitride 8 Treffer
- materials science 8 Treffer
- mathematical model 8 Treffer
- modulation 8 Treffer
- modulation-doped field-effect transistors 8 Treffer
- business.industry 7 Treffer
- cmos 7 Treffer
- spice 7 Treffer
- thin film transistors 7 Treffer
- transconductance 7 Treffer
- transistors 7 Treffer
- analytical modeling 6 Treffer
- characterization 6 Treffer
- compact model 6 Treffer
- current measurement 6 Treffer
- electronic engineering 6 Treffer
- gan hemt 6 Treffer
- junctions 6 Treffer
- logic circuits 6 Treffer
- mobility 6 Treffer
- numerical simulation 6 Treffer
- saturation velocity 6 Treffer
- short-channel effects (sces) 6 Treffer
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29 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 49 (2002-08-01), Heft 8, S. 1484-1487Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 57 (2010-05-01), S. 1093-1101Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 50 (2003-10-01), S. 2135-2143Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 49 (2002-08-01), S. 1484-1487Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 48 (2001-05-01), S. 887-896Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 47 (2000), S. 113-120Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 45 (1998), S. 2489-2498Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 43 (1996), S. 1291-1296Online unknownZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!NachschlagewerkZugriff: