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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- conception. technologies. analyse fonctionnement. essais 159 Treffer
- design. technologies. operation analysis. testing 159 Treffer
- complementary mos technology 150 Treffer
- technologie mos complementaire 150 Treffer
- tecnologia mos complementario 150 Treffer
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45 weitere Werte:
- circuits electriques, optiques et optoelectroniques 74 Treffer
- electric, optical and optoelectronic circuits 74 Treffer
- circuit properties 68 Treffer
- proprietes des circuits 68 Treffer
- circuits electroniques 66 Treffer
- electronic circuits 66 Treffer
- circuits integres par fonction (dont memoires et processeurs) 61 Treffer
- integrated circuits by function (including memories and processors) 61 Treffer
- evaluacion prestacion 54 Treffer
- evaluation performance 54 Treffer
- performance evaluation 54 Treffer
- transistors 46 Treffer
- circuits numeriques 45 Treffer
- digital circuits 45 Treffer
- electronique faible puissance 38 Treffer
- low-power electronics 38 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 31 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 31 Treffer
- implementation 31 Treffer
- circuit integre cmos 30 Treffer
- cmos integrated circuits 30 Treffer
- implementacion 30 Treffer
- memoire non volatile 30 Treffer
- memoria no volatil 30 Treffer
- non volatile memory 30 Treffer
- delay time 29 Treffer
- temps retard 29 Treffer
- tiempo retardo 29 Treffer
- fiabilidad 27 Treffer
- fiabilite 27 Treffer
- interconexion 27 Treffer
- interconnection 27 Treffer
- interconnexion 27 Treffer
- reliability 27 Treffer
- circuit vlsi 26 Treffer
- circuito vlsi 26 Treffer
- vlsi circuit 26 Treffer
- circuit design 23 Treffer
- conception circuit 23 Treffer
- electronica potencia 22 Treffer
- electronique puissance 22 Treffer
- memoire acces direct 22 Treffer
- memoria acceso directo 22 Treffer
- physics 22 Treffer
- physique 22 Treffer
Publikation
- microelectronics and reliability 55 Treffer
- microelectronics journal 45 Treffer
- integration (amsterdam) 27 Treffer
- solid-state electronics 23 Treffer
- microelectronic engineering 11 Treffer
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29 weitere Werte:
- organic electronics (print) 5 Treffer
- materials chemistry and physics 3 Treffer
- papers selected from the ultimate integration on silicon conference 2009, ulis 2009 3 Treffer
- reliability physics of advanced electron devices 3 Treffer
- selected extended papers from ulis 2012 conference 3 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 2 Treffer
- insulating films on semiconductors 2013 2 Treffer
- journal of parallel and distributed computing (print) 2 Treffer
- micro/nano devices and systems 2013: an open thematic journal issue 2 Treffer
- reliability of electron devices, failure physics and analysis 2 Treffer
- special issue devoted to the 2nd international memory workshop (imw 2010) 2 Treffer
- [microscale heat transfer] 1 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 1 Treffer
- 2009 international electron devices and materials symposium (iedms) 1 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 1 Treffer
- comptes rendus de l'academie des sciences. serie iv, physique, astrophysique 1 Treffer
- computers & mathematics with applications (1987) 1 Treffer
- cryogenics (guildford) 1 Treffer
- dielectrics in microelectronics (wodim 2004) 1 Treffer
- fuzzy sets and systems 1 Treffer
- hardware architectures for algebra, cryptology and number theory 1 Treffer
- infrared physics & technology 1 Treffer
- international journal of heat and fluid flow 1 Treffer
- international journal of thermal sciences 1 Treffer
- materials science & engineering. b, solid-state materials for advanced technology 1 Treffer
- modern fuzzy control 1 Treffer
- reliability engineering & systems safety 1 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 1 Treffer
- special issue: containing papers presented at the 2001 lawrence symposium on critical issues in epitaxy, january 3-6, 2001, scottsdale arizona 1 Treffer
Sprache
Geographischer Bezug
180 Treffer
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 4, S. 510-531academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 1, S. 48-61academicJournalZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 155-158academicJournalZugriff:
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In: Solid-state electronics, Jg. 98 (2014), S. 26-31academicJournalZugriff:
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In: 14TH Workshop on dielectrics in microelectronics (WoDiM 2006), Jg. 47 (2007), Heft 4-5, S. 739-742KonferenzZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 137-146academicJournalZugriff:
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In: Microelectronic engineering, Jg. 105 (2013), S. 81-85academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 12, S. 2357-2365academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 9, S. 585-593academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 45 (2012), Heft 1, S. 33-45academicJournalZugriff:
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In: Microelectronics journal, Jg. 40 (2009), Heft 6, S. 1000-1006academicJournalZugriff:
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In: Microelectronics journal, Jg. 40 (2009), Heft 1, S. 156-176academicJournalZugriff:
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In: Solid-state electronics, Jg. 53 (2009), Heft 10, S. 1092-1098academicJournalZugriff:
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In: Special Issue Devoted to the 2nd International Memory Workshop (IMW 2010), Jg. 58 (2011), Heft 1, S. 54-61academicJournalZugriff:
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In: Microelectronics journal, Jg. 42 (2011), Heft 5, S. 754-757academicJournalZugriff:
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In: Microelectronics journal, Jg. 40 (2009), Heft 6, S. 958-965academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 2-4, S. 301-310academicJournalZugriff:
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In: Microelectronic engineering, Jg. 87 (2010), Heft 2, S. 150-158academicJournalZugriff:
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In: Papers Selected from the Ultimate Integration on Silicon Conference 2009, ULIS 2009, Jg. 53 (2009), Heft 12, S. 1212-1219academicJournalZugriff: