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In: Integration, the VLSI Journal, Jg. 60 (2018), S. 48-55academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 60 (2018), S. 25-38academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 60 (2018), S. 63-73academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 60 (2018), S. 56-62academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 59 (2017-09-01), S. 10-22academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 59 (2017-09-01), S. 243-246academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 59 (2017-09-01), S. 206-217academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 57 (2017-03-01), S. 1-10academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 56 (2017), S. 70-76academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 55 (2016-09-01), S. 254-264academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 55 (2016-09-01), S. 330-340academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 55 (2016-09-01), S. 194-201academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 55 (2016-09-01), S. 57-66academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 52 (2016), S. 122-128academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 52 (2016), S. 228-236academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 52 (2016), S. 253-259academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 52 (2016), S. 195-207academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 52 (2016), S. 217-227academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 50 (2015-06-01), S. 28-38academicJournalZugriff:
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In: Integration, the VLSI Journal, Jg. 50 (2015-06-01), S. 16-27academicJournalZugriff: