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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- components, circuits, devices and systems 28 Treffer
- computing and processing 28 Treffer
- communication, networking and broadcast technologies 17 Treffer
- hardware 12 Treffer
- system-on-a-chip 10 Treffer
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45 weitere Werte:
- software 9 Treffer
- manufacturing 8 Treffer
- post-silicon validation 8 Treffer
- algorithm design and analysis 7 Treffer
- logic gates 7 Treffer
- signal processing and analysis 7 Treffer
- computer architecture 6 Treffer
- hardware design languages 6 Treffer
- integrated circuit modeling 6 Treffer
- power, energy and industry applications 6 Treffer
- clocks 5 Treffer
- measurement 5 Treffer
- real time systems 5 Treffer
- registers 5 Treffer
- testing 5 Treffer
- trace signal selection 5 Treffer
- circuit testing 4 Treffer
- costs 4 Treffer
- electronic circuits 4 Treffer
- gate array circuits 4 Treffer
- industries 4 Treffer
- integrated circuit design 4 Treffer
- monitoring 4 Treffer
- process design 4 Treffer
- real-time computing 4 Treffer
- robotics and control systems 4 Treffer
- time to market 4 Treffer
- timing 4 Treffer
- validation 4 Treffer
- visibility 4 Treffer
- circuit simulation 3 Treffer
- data analysis 3 Treffer
- job shop scheduling 3 Treffer
- logic 3 Treffer
- microprocessors 3 Treffer
- observability 3 Treffer
- optimization 3 Treffer
- resource management 3 Treffer
- silicon debug 3 Treffer
- acceleration 2 Treffer
- aerospace 2 Treffer
- automatic test equipment 2 Treffer
- bioengineering 2 Treffer
- circuit faults 2 Treffer
- computer science 2 Treffer
Verlag
Publikation
- ieee transactions on computer-aided design of integrated circuits & systems 4 Treffer
- 2007 design, automation & test in europe conference & exhibition, design, automation & test in europe conference & exhibition, 2007. date '07 2 Treffer
- ieee design & test of computers, design & test of computers, ieee, ieee des. test. comput. 2 Treffer
- ieee transactions on computers 2 Treffer
- ieee transactions on very large scale integration (vlsi) systems 2 Treffer
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32 weitere Werte:
- 2006 ifip international conference on very large scale integration, very large scale integration, 2006 ifip international conference on 1 Treffer
- 2007 ieee international high level design validation and test workshop, high level design validation and test workshop, 2007. hlvdt 2007. ieee international 1 Treffer
- 2007 ieee international test conference, test conference, 2007. itc 2007. ieee international 1 Treffer
- 2007 ieee/acm international conference on computer-aided design, computer-aided design, 2007. iccad 2007. ieee/acm international conference on 1 Treffer
- 2008 11th ieee workshop on design and diagnostics of electronic circuits and systems, design and diagnostics of electronic circuits and systems, 2008. ddecs 2008. 11th ieee workshop on 1 Treffer
- 2008 asia and south pacific design automation conference, design automation conference, 2008. aspdac 2008. asia and south pacific 1 Treffer
- 2009 international test conference, test conference, 2009. itc 2009. international 1 Treffer
- 2010 15th asia and south pacific design automation conference (asp-dac), design automation conference (asp-dac), 2010 15th asia and south pacific 1 Treffer
- 2010 asia pacific software engineering conference, software engineering conference (apsec), 2010 17th asia pacific 1 Treffer
- 2010 design, automation & test in europe conference & exhibition (date 2010), design, automation & test in europe conference & exhibition (date), 2010 1 Treffer
- 2010 ieee international test conference, test conference (itc), 2010 ieee international 1 Treffer
- 2010 international conference on field-programmable technology, field-programmable technology (fpt), 2010 international conference on 1 Treffer
- 2011 48th acm/edac/ieee design automation conference (dac), design automation conference (dac), 2011 48th acm/edac/ieee 1 Treffer
- 2011 ieee/acm international conference on computer-aided design (iccad), computer-aided design (iccad), 2011 ieee/acm international conference on 1 Treffer
- 2014 24th international conference on field programmable logic and applications (fpl), field programmable logic and applications (fpl), 2014 24th international conference on 1 Treffer
- 2014 51st acm/edac/ieee design automation conference (dac), design automation conference (dac), 2014 51st acm/edac/ieee 1 Treffer
- 2016 1st ieee international verification and security workshop (ivsw), verification and security workshop (ivsw), ieee international 1 Treffer
- 2016 26th international conference on field programmable logic and applications (fpl) 1 Treffer
- 2016 26th international conference on field programmable logic and applications (fpl), field programmable logic and applications (fpl), 2016 26th international conference on 1 Treffer
- 2016 ieee east-west design & test symposium (ewdts), east-west design & test symposium (ewdts), 2016 ieee 1 Treffer
- 2016 ieee international test conference (itc), test conference (itc), 2016 ieee international 1 Treffer
- 2017 18th ieee latin american test symposium (lats), test symposium (lats), 2017 18th ieee latin american 1 Treffer
- 2018 4th international conference for convergence in technology (i2ct), convergence in technology (i2ct), 2018 4th international conference for 1 Treffer
- 2020 design, automation & test in europe conference & exhibition (date) 1 Treffer
- 20th international symposium on quality electronic design (isqed), quality electronic design (isqed), 20th international symposium on 1 Treffer
- computer 1 Treffer
- design, automation & test in europe conference & exhibition (date), 2017 1 Treffer
- ieee design & test, design & test, ieee, ieee des. test 1 Treffer
- ieee transactions on computers, computers, ieee transactions on, ieee trans. comput. 1 Treffer
- proceedings international test conference 2001 (cat. no.01ch37260), test conference, 2001. proceedings. international, international test conference 1 Treffer
- proceedings of the asp-dac asia and south pacific design automation conference, 2003., design automation conference, 2003. proceedings of the asp-dac 2003. asia and south pacific, design automation conference 1 Treffer
- proceedings. international test conference, test conference, 2002. proceedings. international, international test conference 1 Treffer
Sprache
39 Treffer
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In: 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC), 2011-06-01, S. 860-865Online KonferenzZugriff:
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In: 2007 Design, Automation & Test in Europe Conference & Exhibition, 2007-04-01, S. 1Online KonferenzZugriff:
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In: Proceedings. International Test Conference, 2002, S. 584-589KonferenzZugriff:
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In: 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2008-04-01, S. 1KonferenzZugriff:
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In: 2007 IEEE/ACM International Conference on Computer-Aided Design, 2007-11-01, S. 91Online KonferenzZugriff:
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In: IEEE Transactions on Computers, Jg. 60 (2011-07-01), Heft 7, S. 937-950Online academicJournalZugriff:
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In: 2006 IFIP International Conference on Very Large Scale Integration, 2006-10-01, S. 385KonferenzZugriff:
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In: 2009 International Test Conference, 2009-11-01, S. 1KonferenzZugriff:
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In: IEEE Design & Test, Jg. 33 (2016-12-01), Heft 6, S. 55-55Online academicJournalZugriff:
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In: 2008 Asia and South Pacific Design Automation Conference, 2008, S. 416Online KonferenzZugriff:
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In: 2007 IEEE International High Level Design Validation and Test Workshop, 2007-11-01, S. 53KonferenzZugriff:
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In: 2007 IEEE International Test Conference, 2007-10-01, S. 1KonferenzZugriff:
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In: 2007 Design, Automation & Test in Europe Conference & Exhibition, 2007-04-01, S. 1Online KonferenzZugriff:
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In: Computer, Jg. 41 (2008-07-01), Heft 7, S. 47Online academicJournalZugriff:
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In: IEEE Design & Test of Computers, Jg. 25 (2008-05-01), Heft 3, S. 204Online academicJournalZugriff:
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In: IEEE Design & Test of Computers, Jg. 24 (2007-03-01), Heft 2, S. 193Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 19 (2011-04-01), Heft 4, S. 559-570Online academicJournalZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, Jg. 31 (2012-08-01), Heft 8, S. 1263-1274Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 20 (2012-11-01), Heft 11, S. 1997-2010Online academicJournalZugriff: