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In: IEEE Transactions on Device and Materials Reliability, Jg. 20 (2020-06-01), S. 459-467Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 18 (2018-03-01), S. 27-36Online unknownZugriff:
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In: IEEE transactions on device and materials reliability, Jg. 3 (2003), Heft 3, S. 79-84Online academicJournalZugriff:
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In: IEEE transactions on device and materials reliability, Jg. 2 (2002), Heft 1, S. 2-8Online academicJournalZugriff:
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In: IEEE transactions on device and materials reliability, Jg. 1 (2001), Heft 1, S. 23-32Online academicJournalZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!academicJournalZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 11 (2011-09-01), S. 426-432Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 10 (2010-09-01), S. 347-352Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 11 (2011-03-01), S. 179-186Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 9 (2009-06-01), S. 147-162Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 11 (2011-03-01), S. 44-49Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 7 (2007-06-01), S. 324-332Online unknownZugriff:
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Time-Dependent Variability Related to BTI Effects in MOSFETs: Impact on CMOS Differential AmplifiersIn: IEEE Transactions on Device and Materials Reliability, Jg. 9 (2009-06-01), S. 305-310Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 8 (2008-09-01), S. 501-508Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 5 (2005-09-01), S. 509-514Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 7 (2007-12-01), S. 509-517Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 4 (2004-09-01), S. 542-548Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 1 (2001), S. 190-203Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 2 (2002-03-01), S. 2-8Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 4 (2004-03-01), S. 92-98Online unknownZugriff: