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45 weitere Werte:
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- resistors 8 Treffer
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- operational amplifiers 7 Treffer
- transconductance 7 Treffer
- bandwidth 6 Treffer
- charge pumps 6 Treffer
- driver circuits 6 Treffer
- gain 6 Treffer
- inductors 6 Treffer
- noise measurement 6 Treffer
- parasitic capacitance 6 Treffer
- radiofrequency amplifiers 6 Treffer
- topology 6 Treffer
- ultra wideband technology 6 Treffer
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- physics 5 Treffer
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- analytical models 4 Treffer
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102 Treffer
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 573KonferenzZugriff:
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The impact of strain technology on device performnance and reliability for sub-90nm FUSI SOI MOSFETsIn: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 593KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 597KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 601KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 757KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 863KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 917KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 969KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 17KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 91KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 313KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 341KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 465KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 497KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 629KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 859KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 875KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 885KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 1017KonferenzZugriff:
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In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits, 2007-12-01, S. 993KonferenzZugriff: