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Weniger Treffer
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Schlagwort
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 645 Treffer
- [spi]engineering sciences [physics] 194 Treffer
- [spi.tron]engineering sciences [physics]/electronics 193 Treffer
- [phys.phys.phys-ins-det]physics [physics]/physics [physics]/instrumentation and detectors [physics.ins-det] 127 Treffer
- pacs 85.42 87 Treffer
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45 weitere Werte:
- [spi.opti]engineering sciences [physics]/optics / photonic 76 Treffer
- [spi.elec]engineering sciences [physics]/electromagnetism 73 Treffer
- cmos 67 Treffer
- [info]computer science [cs] 60 Treffer
- cmos integrated circuits 48 Treffer
- [spi.nrj]engineering sciences [physics]/electric power 47 Treffer
- [phys]physics [physics] 42 Treffer
- [spi.signal]engineering sciences [physics]/signal and image processing 37 Treffer
- cmos image sensor 36 Treffer
- [phys.phys.phys-optics]physics [physics]/physics [physics]/optics [physics.optics] 34 Treffer
- [phys.hexp]physics [physics]/high energy physics - experiment [hep-ex] 31 Treffer
- atlas 27 Treffer
- electronics: readout 27 Treffer
- fdsoi 27 Treffer
- [spi.mat]engineering sciences [physics]/materials 26 Treffer
- semiconductor detector: pixel 26 Treffer
- cmos technology 22 Treffer
- integrated circuit: design 21 Treffer
- mosfet 20 Treffer
- pacs 8542 20 Treffer
- [phys.cond.cm-ms]physics [physics]/condensed matter [cond-mat]/materials science [cond-mat.mtrl-sci] 19 Treffer
- performance 19 Treffer
- sensors 19 Treffer
- [info.info-ts]computer science [cs]/signal and image processing 18 Treffer
- cms 18 Treffer
- semiconductor detector 18 Treffer
- silicon-on-insulator 18 Treffer
- [phys.cond.cm-gen]physics [physics]/condensed matter [cond-mat]/other [cond-mat.other] 17 Treffer
- cmos memory circuits 17 Treffer
- mems 17 Treffer
- [info.info-ai]computer science [cs]/artificial intelligence [cs.ai] 16 Treffer
- [info.info-mo]computer science [cs]/modeling and simulation 16 Treffer
- [info.info-ar]computer science [cs]/hardware architecture [cs.ar] 15 Treffer
- detectors 15 Treffer
- upgrade 15 Treffer
- [info.info-et]computer science [cs]/emerging technologies [cs.et] 14 Treffer
- detector 13 Treffer
- noise 13 Treffer
- particulate matter 13 Treffer
- reram 13 Treffer
- [sdu.astr]sciences of the universe [physics]/astrophysics [astro-ph] 12 Treffer
- 60ghz 12 Treffer
- antenna measurements 12 Treffer
- front-end electronics 12 Treffer
- [sdu.astr.im]sciences of the universe [physics]/astrophysics [astro-ph]/instrumentation and methods for astrophysic [astro-ph.im] 11 Treffer
Verlag
- ieee 387 Treffer
- ieee computer society 34 Treffer
- spie 24 Treffer
- springer international publishing 15 Treffer
- institute of electrical and electronics engineers inc. 14 Treffer
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28 weitere Werte:
- springer 11 Treffer
- ieee,cop. 2013, piscataway (n.j.) 8 Treffer
- osa 7 Treffer
- ieee comput. soc. press, los alamitos, ca, usa 6 Treffer
- ieee, new york, ny, usa 6 Treffer
- xx 6 Treffer
- acm 5 Treffer
- american institute of aeronautics and astronautics 5 Treffer
- crc press 5 Treffer
- ieee, piscataway, nj, usa 5 Treffer
- ieee comput. soc. press, washington, dc, usa 4 Treffer
- stanford linear accelerator center 4 Treffer
- iee 3 Treffer
- ieee nuclear and plasma sciences society 3 Treffer
- institute of electrical and electronics engineers 3 Treffer
- iop science 3 Treffer
- melville 3 Treffer
- springer verlag 3 Treffer
- acm press 2 Treffer
- aip 2 Treffer
- csrea press 2 Treffer
- ieee comput. soc, los alamitos, ca, usa 2 Treffer
- ieee press 2 Treffer
- ieee society 2 Treffer
- int. test conference, altoona, pa, usa 2 Treffer
- iop publishing 2 Treffer
- spie int. soc. opt. eng 2 Treffer
- ieee-cs 1 Treffer
Publikation
- ieee international electron devices meeting, ; https://hal.science/hal-00604339 ; ieee international electron devices meeting,, dec 2010, san francisco, united states 11 Treffer
- ieee 63rd electronic components and technology conf. ; https://hal.science/hal-01018405 ; ieee 63rd electronic components and technology conf., may 2013, las vegas, united states. pp.674-682 8 Treffer
- reliability physics symposium (irps), 2020 ieee international ; irps 2020 - ieee international reliability physics symposium ; https://hal.science/hal-04019222 ; irps 2020 - ieee international reliability physics symposium, ieee, apr 2020, dallas (texas), united states. pp.1-5, ⟨10.1109/irps45951.2020.9128346⟩ 7 Treffer
- 2019 ieee international electron devices meeting (iedm) ; https://hal.science/hal-02399624 ; 2019 ieee international electron devices meeting (iedm), dec 2019, san francisco, united states. ⟨10.1109/iedm19573.2019.8993555⟩ 6 Treffer
- 2020 ieee international electron devices meeting (iedm) ; https://hal.science/hal-03218937 ; 2020 ieee international electron devices meeting (iedm), dec 2020, san francisco (virtual), united states. pp.36.5.1-36.5.4, ⟨10.1109/iedm13553.2020.9372019⟩ 6 Treffer
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45 weitere Werte:
- cleo: qels fundamental science 2018 ; https://hal.science/hal-02006480 ; cleo: qels fundamental science 2018, may 2018, san jose, united states. pp.fth1e.5, ⟨10.1364/cleo_qels.2018.fth1e.5⟩ 6 Treffer
- ieee international electron devices meeting, ; https://hal.science/hal-01074810 ; ieee international electron devices meeting,, dec 2010, san francisco, united states 6 Treffer
- pos ; topical workshop on electronics for particle physics ; https://hal.science/hal-02410855 ; topical workshop on electronics for particle physics, sep 2017, santa cruz, united states. pp.005, ⟨10.22323/1.313.0005⟩ 6 Treffer
- proceedings of 2023 ieee 41st vlsi test symposium (vts) ; ieee vlsi test symposium (vts 2023) ; https://hal.science/hal-04103973 ; ieee vlsi test symposium (vts 2023), ieee, apr 2023, san diego, ca, united states. ⟨10.1109/vts56346.2023.10139932⟩ ; https://tttc-vts.org/public_html/new/2023/ 6 Treffer
- 2014 vlsi-technology technical digest ; 2014 ieee symposium on vlsi technology ; https://hal.science/hal-02003853 ; 2014 ieee symposium on vlsi technology, jun 2014, honolulu, united states. pp.66-67, ⟨10.1109/vlsit.2014.6894369⟩ 5 Treffer
- 2020 ieee radio and wireless symposium (rws) ; https://hal.science/hal-02529654 ; 2020 ieee radio and wireless symposium (rws), jan 2020, san antonio, united states. pp.72-75, ⟨10.1109/rws45077.2020.9050055⟩ 5 Treffer
- 21st ieee international interconnect technology conference ; iitc: international interconnect technology conference 5 Treffer
- nuclear and space radiation effects conference (nsrec 2018) ; https://ujm.hal.science/ujm-01964663 ; nuclear and space radiation effects conference (nsrec 2018), jul 2018, kona, united states. pp.b3 5 Treffer
- photonics west 2020 ; https://cea.hal.science/cea-02432909 ; photonics west 2020, spie, feb 2020, san francisco, united states. ⟨10.1117/12.2544185⟩ 5 Treffer
- photonics west 2020 ; https://cea.hal.science/cea-02432952 ; photonics west 2020, spie, feb 2020, san francisco, united states. ⟨10.1117/12.2546128⟩ 5 Treffer
- proc of ieee international reliability physics symposium (irps'11) ; ieee international reliability physics symposium (irps'11), monterey, ca, usa, april 10-14 ; https://hal.science/hal-00599391 ; ieee international reliability physics symposium (irps'11), monterey, ca, usa, april 10-14, apr 2011, monterey, ca., united states. pp.3f.4.1 - 3f.4.6, ⟨10.1109/irps.2011.5784499⟩ 5 Treffer
- proceedings of the 2014 ieee international reliability physics symposium ; irps ; https://hal.science/hal-02153560 ; irps, jun 2014, waikoloa hi, united states. pp.2e.6.1-2e.6.5, ⟨10.1109/irps.2014.6860604⟩ 5 Treffer
- 2014 ieee nuclear science symposium and medical imaging conference (2014 nss/mic), and 21st symposium on room-temperature semiconductor x-ray and gamma-ray detectors ; https://hal.in2p3.fr/in2p3-01082061 ; 2014 ieee nuclear science symposium and medical imaging conference (2014 nss/mic), and 21st symposium on room-temperature semiconductor x-ray and gamma-ray detectors, nov 2014, seattle, united states 4 Treffer
- 2016 ieee nuclear and space radiation effects conference (nsrec 2016) ; https://hal.science/hal-01528219 ; 2016 ieee nuclear and space radiation effects conference (nsrec 2016), jul 2016, portland, united states ; http://www.nsrec.com/ 4 Treffer
- 2017 ieee nuclear & space radiation effects conference (nsrec 2017) ; https://hal.science/hal-01621110 ; 2017 ieee nuclear & space radiation effects conference (nsrec 2017), oct 2017, new orleans, united states 4 Treffer
- 2022 international technical meeting of the institute of navigation ; https://hal.science/hal-03770818 ; 2022 international technical meeting of the institute of navigation, institute of navigation, jan 2022, long beach, united states. pp.1371-1379, ⟨10.33012/2022.18263⟩ ; https://www.ion.org/itm/index.cfm 4 Treffer
- ieee international conference on rebooting computing 4 Treffer
- ieee/acm international symposium on nanoscale architectures (nanoarch) ; https://hal.science/hal-01489373 ; ieee/acm international symposium on nanoscale architectures (nanoarch), 2015, boston, ma, united states 4 Treffer
- nuclear and space radiation effects conference (nsrec 2015) ; https://ujm.hal.science/ujm-01185833 ; nuclear and space radiation effects conference (nsrec 2015), jul 2015, boston, united states 4 Treffer
- nuclear and space radiation effects conference (nsrec 2015) ; https://ujm.hal.science/ujm-01185888 ; nuclear and space radiation effects conference (nsrec 2015), ieee, jul 2015, boston, united states 4 Treffer
- proceedings iscas 2017 : ieee international symposium on circuits and systems 4 Treffer
- proceedings of the 2016 ieee symposium on vlsi technology ; 2016 ieee symposium on vlsi technology ; https://laas.hal.science/hal-01730659 ; 2016 ieee symposium on vlsi technology, jun 2016, honolulu, united states. ⟨10.1109/vlsit.2016.7573407⟩ 4 Treffer
- residual stress, thermomechanics & infrared imaging and inverse problems, proceedings of the 2019 annual conference on experimental and applied mechanics ; 2019 sem annual conference and exposition on experimental and applied mechanics ; https://hal.science/hal-02443369 ; 2019 sem annual conference and exposition on experimental and applied mechanics, jun 2019, reno, united states. ⟨10.1007/978-3-030-30098-2_7⟩ 4 Treffer
- sirf 2009 ; https://hal.science/hal-00602807 ; sirf 2009, jan 2009, san diego, californie, united states 4 Treffer
- spie bios, imaging, manipulation, and analysis of biomolecules, cells, and tissues xiii ; https://hal.science/hal-01385645 ; spie bios, imaging, manipulation, and analysis of biomolecules, cells, and tissues xiii, spie, feb 2015, san francisco, united states. ⟨10.1117/12.2076149⟩ ; http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=2194767 4 Treffer
- 2009 ieee international conference on integrated circuit design and technology, proceedings ; https://hal.science/hal-01430105 ; 2009 ieee international conference on integrated circuit design and technology, proceedings, 2009, austin, tx, united states. pp.113-120, ⟨10.1109/icicdt.2009.5166277⟩ 3 Treffer
- 2014 iedm technical digest ; 2014 ieee international electron devices meeting (iedm) ; https://hal.univ-grenoble-alpes.fr/hal-02049421 ; 2014 ieee international electron devices meeting (iedm), dec 2014, san francisco, united states. pp.7.2.1-7.2.4, ⟨10.1109/iedm.2014.7047002⟩ 3 Treffer
- 2014 iedm technical digest ; 2014 ieee international electron devices meeting ; https://cea.hal.science/cea-01839848 ; 2014 ieee international electron devices meeting, dec 2014, san francisco, united states. pp.28.4.1-28.4.4, ⟨10.1109/iedm.2014.7047126⟩ 3 Treffer
- 2015 s3s proceedings ; 2015 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s) ; https://hal.science/hal-02049810 ; 2015 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s), oct 2015, rohnert park, united states. pp.9a.4, ⟨10.1109/s3s.2015.7333546⟩ 3 Treffer
- 2018 ieee international electron devices meeting (iedm) ; https://hal.science/hal-02011124 ; 2018 ieee international electron devices meeting (iedm), dec 2018, san francisco, united states. pp.20.6.1-20.6.4, ⟨10.1109/iedm.2018.8614639⟩ 3 Treffer
- 2022 ieee/mtt-s international microwave symposium, ims 2022 ; https://hal.science/hal-03792411 ; 2022 ieee/mtt-s international microwave symposium, ims 2022, jun 2022, denver, united states. pp.248-250, ⟨10.1109/ims37962.2022.9865564⟩ 3 Treffer
- aiaa 2018 ; aiaa aviation 2018 ; https://hal.science/hal-04472889 ; aiaa aviation 2018, jun 2018, atlanta, united states. ⟨10.2514/6.2018-3057⟩ 3 Treffer
- aip conf.proc. ; 18th international conference on positron annihilation ; https://hal.science/hal-03830379 ; 18th international conference on positron annihilation, feb 2018, orlando, united states. pp.030002, ⟨10.1063/1.5135825⟩ 3 Treffer
- american astronomical society, aas meeting #233 ; https://hal.science/hal-02323395 ; american astronomical society, aas meeting #233, jan 2019, seattle, united states 3 Treffer
- annual conference on nanotechnology and advanced materials ; https://hal.science/hal-03029510 ; annual conference on nanotechnology and advanced materials, nov 2019, san francisco, united states 3 Treffer
- iedm2021 - ieee international electron devices meeting ; https://hal.science/hal-03762149 ; iedm2021 - ieee international electron devices meeting, dec 2021, san francisco, united states. pp.39.4.1-39.4.4, ⟨10.1109/iedm19574.2021.9720522⟩ ; https://ieeexplore.ieee.org/xpl/conhome/9720433/proceeding 3 Treffer
- ieee international soi conference ; https://hal.science/hal-00604213 ; ieee international soi conference, oct 2009, foster city, united states. ⟨10.1109/soi.2009.5318735⟩ ; https://ieeexplore.ieee.org/document/5318735 3 Treffer
- nss-mic_2015 ; https://hal.in2p3.fr/in2p3-01267327 ; nss-mic_2015, nov 2015, san diego, united states ; http://www.nss-mic.org/2015/ 3 Treffer
- pos ; topical workshop on electronics for particle physics ; https://hal.science/hal-02058531 ; topical workshop on electronics for particle physics, sep 2017, santa cruz, united states. pp.021, ⟨10.22323/1.313.0021⟩ 3 Treffer
- proc. of nanotech 2007 ; nanotech 2007 ; https://hal.science/hal-00156362 ; nanotech 2007, may 2007, santa clara, california, united states. pp.21-24 3 Treffer
- proceedings of spie ; spie nanoscience + engineering: biosensing and nanomedecine ix 3 Treffer
- 2012 ieee nuclear science symposium and medical imaging conference (2012 nss/mic) ; https://hal.in2p3.fr/in2p3-00753748 ; 2012 ieee nuclear science symposium and medical imaging conference (2012 nss/mic), oct 2012, anaheim, california, united states. ⟨10.1109/nssmic.2012.6551351⟩ 2 Treffer
- 2016 annual reliability and maintainability symposium (rams) ; https://normandie-univ.hal.science/hal-02184712 ; 2016 annual reliability and maintainability symposium (rams), jan 2016, tucson, united states. pp.7448024, ⟨10.1109/rams.2016.7448024⟩ 2 Treffer
- 2021 ieee radio frequency integrated circuits symposium (rfic/ims) ; https://hal.science/hal-03306898 ; 2021 ieee radio frequency integrated circuits symposium (rfic/ims), jun 2021, atlanta, united states. pp.195-198, ⟨10.1109/rfic51843.2021.9490464⟩ 2 Treffer
- ieee international conference on microelectronic systems education 2 Treffer
Sprache
Geographischer Bezug
1.436 Treffer
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In: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States, 2023Online KonferenzZugriff:
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In: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States, 2023Online KonferenzZugriff:
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In: 2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems ; https://cea.hal.science/cea-04228432 ; 2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, Jan 2023, Las Vegas, United States. ⟨10.1109/SiRF56960.2023.10046233⟩ ; https://ieeexplore.ieee.org/document/10046233, 2023Online KonferenzZugriff:
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In: ITC 2023 - IEEE International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240449 ; ITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States, 2023Online KonferenzZugriff:
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In: ISCAS 2023 - IEEE International Symposium on Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241285 ; ISCAS 2023 - IEEE International Symposium on Circuits and Systems, May 2023, Monterey, 2023Online KonferenzZugriff:
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In: ISCAS 2023 - IEEE International Symposium on Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241285 ; ISCAS 2023 - IEEE International Symposium on Circuits and Systems, May 2023, Monterey, 2023Online KonferenzZugriff:
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In: ISCAS 2023 - IEEE International Symposium on Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241285 ; ISCAS 2023 - IEEE International Symposium on Circuits and Systems, May 2023, Monterey, 2023Online KonferenzZugriff:
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In: Custom Integrated Circuit Conference 2024 ; https://cea.hal.science/cea-04563150 ; Custom Integrated Circuit Conference 2024, IEEE, Apr 2024, Denver, United States. pp.11-6, 2024Online KonferenzZugriff:
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In: Custom Integrated Circuit Conference 2024 ; https://cea.hal.science/cea-04563150 ; Custom Integrated Circuit Conference 2024, IEEE, Apr 2024, Denver, United States. pp.11-6, 2024Online KonferenzZugriff:
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In: Radio Frequency Integrated Circuits Symposium / International Microwave Symposium ; https://hal.science/hal-03727320 ; Radio Frequency Integrated Circuits Symposium / International Microwave Symposium, Jun 2022, Denver, United States, 2022Online KonferenzZugriff:
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In: Radio Frequency Integrated Circuits Symposium / International Microwave Symposium ; https://hal.science/hal-03727320 ; Radio Frequency Integrated Circuits Symposium / International Microwave Symposium, Jun 2022, Denver, United States, 2022Online KonferenzZugriff:
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In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; IEEE International Reliability Physics Symposium (IRPS 2022) ; https://hal.science/hal-03999581 ; IEEE International Reliability Physics Symposium (IRPS 2022), Mar 2022, Dallas, TX (en ligne), United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022Online KonferenzZugriff:
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In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; https://hal.science/hal-03659269 ; 2022 IEEE International Reliability Physics Symposium (IRPS), Mar 2022, Dallas, United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022Online KonferenzZugriff:
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In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; IEEE International Reliability Physics Symposium (IRPS 2022) ; https://hal.science/hal-03999581 ; IEEE International Reliability Physics Symposium (IRPS 2022), Mar 2022, Dallas, TX (en ligne), United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022Online KonferenzZugriff:
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In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; https://hal.science/hal-03659269 ; 2022 IEEE International Reliability Physics Symposium (IRPS), Mar 2022, Dallas, United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022Online KonferenzZugriff:
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In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; IEEE International Reliability Physics Symposium (IRPS 2022) ; https://hal.science/hal-03999581 ; IEEE International Reliability Physics Symposium (IRPS 2022), Mar 2022, Dallas, TX (en ligne), United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022Online KonferenzZugriff:
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In: 2022 IEEE International Reliability Physics Symposium (IRPS) ; https://hal.science/hal-03659269 ; 2022 IEEE International Reliability Physics Symposium (IRPS), Mar 2022, Dallas, United States. pp.11A.3-1-11A.3-7, ⟨10.1109/IRPS48227.2022.9764431⟩, 2022Online KonferenzZugriff:
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In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; https://shs.hal.science/halshs-03515486 ; 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩, 2021Online KonferenzZugriff:
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In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; https://shs.hal.science/halshs-03515486 ; 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩, 2021Online KonferenzZugriff:
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In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; https://shs.hal.science/halshs-03515486 ; 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩, 2021Online KonferenzZugriff: