Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary metal oxide semiconductors 48 Treffer
- radiation effects 40 Treffer
- transistors 34 Treffer
- logic circuits 23 Treffer
- cmos 18 Treffer
-
45 weitere Werte:
- threshold voltage 17 Treffer
- total ionizing dose (tid) 17 Treffer
- integrated circuits 15 Treffer
- ionizing radiation 15 Treffer
- mosfet 15 Treffer
- cmos integrated circuits 14 Treffer
- sensitivity 14 Treffer
- degradation 13 Treffer
- inverters 13 Treffer
- detectors 12 Treffer
- photodiodes 12 Treffer
- dark current 11 Treffer
- metal oxide semiconductor field-effect transistors 11 Treffer
- mosfets 11 Treffer
- single event effects 11 Treffer
- transient analysis 11 Treffer
- annealing 10 Treffer
- gamma rays 10 Treffer
- noise 10 Treffer
- radiation hardening (electronics) 10 Treffer
- cmos technology 9 Treffer
- electric potential 9 Treffer
- irradiation 9 Treffer
- cmos image sensors 8 Treffer
- layout 8 Treffer
- leakage current 8 Treffer
- radiation 8 Treffer
- radiation hardening 8 Treffer
- shallow trench isolation (sti) 8 Treffer
- silicon 8 Treffer
- stray currents 8 Treffer
- image sensors 7 Treffer
- integrated circuit modeling 7 Treffer
- ionizing radiation dosage 7 Treffer
- semiconductor device modeling 7 Treffer
- temperature measurement 7 Treffer
- application-specific integrated circuits 6 Treffer
- dielectrics 6 Treffer
- electric fields 6 Treffer
- field-effect transistors 6 Treffer
- leakage currents 6 Treffer
- switches 6 Treffer
- total ionizing dose 6 Treffer
- application specific integrated circuits 5 Treffer
- doping 5 Treffer
Publikation
Sprache
88 Treffer
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1835-1845Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1284-1292Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1256-1262Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), Heft 5, S. 573-580Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 62 (2015-10-15), Heft 5b, S. 2302-2309Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 45-53Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-07-01), Heft 7, S. 1444-1452Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), Heft 5, S. 687-696Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1906-1915Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019), Heft 1, S. 111-119Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-04-01), Heft 4, S. 752-759Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 92-100Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 84-91Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-06-01), Heft 6, S. 1118-1124Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 101-110Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-09-01), Heft 9, S. 2505-2510Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 62 (2015-08-15), Heft 4b, S. 1888-1897Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-08-01), Heft 8, S. 1519-1524Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-12-01), Heft 6, S. 3265-3273Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 59 (2012-04-15), Heft 4, S. 918-926Online academicJournalZugriff: