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Weniger Treffer
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- PASCAL Archive 283 Treffer
- Gale General OneFile 31 Treffer
- Applied Science & Technology Source 17 Treffer
- Gale Academic OneFile 16 Treffer
- Complementary Index 13 Treffer
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10 weitere Werte:
- Academic Search Index 12 Treffer
- OpenAIRE 7 Treffer
- Business Source Ultimate 6 Treffer
- BASE 4 Treffer
- British Library Document Supply Centre Inside Serials & Conference Proceedings 4 Treffer
- SwePub 4 Treffer
- Networked Digital Library of Theses & Dissertations 2 Treffer
- Directory of Open Access Journals 1 Treffer
- Environment Complete 1 Treffer
- Science Citation Index Expanded 1 Treffer
Art der Quelle
Schlagwort
- electronique 283 Treffer
- exact sciences and technology 283 Treffer
- sciences exactes et technologie 283 Treffer
- applied sciences 281 Treffer
- sciences appliquees 281 Treffer
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45 weitere Werte:
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 255 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 255 Treffer
- transistors 228 Treffer
- transistor effet champ 151 Treffer
- field effect transistor 147 Treffer
- transistor mos 141 Treffer
- mos transistor 136 Treffer
- transistor efecto campo 130 Treffer
- lightly doped drain 127 Treffer
- drain peu dope 104 Treffer
- dren poco dopado 67 Treffer
- porteur chaud 54 Treffer
- caracteristique courant tension 53 Treffer
- hot carrier 53 Treffer
- portador caliente 52 Treffer
- voltage current curve 52 Treffer
- caracteristica corriente tension 50 Treffer
- etude experimentale 46 Treffer
- experimental study 46 Treffer
- estudio experimental 45 Treffer
- fiabilite 44 Treffer
- mosfet 44 Treffer
- reliability 44 Treffer
- caracteristica electrica 43 Treffer
- caracteristique electrique 43 Treffer
- electrical characteristic 43 Treffer
- fiabilidad 42 Treffer
- silicon 42 Treffer
- transistor mosfet 42 Treffer
- modeling 41 Treffer
- modelisation 41 Treffer
- modelizacion 41 Treffer
- integrated circuits 39 Treffer
- optics 38 Treffer
- optique 38 Treffer
- seuil tension 38 Treffer
- voltage threshold 38 Treffer
- umbral tension 37 Treffer
- telecommunications 36 Treffer
- complementary mos technology 35 Treffer
- technologie mos complementaire 35 Treffer
- circuits integres 34 Treffer
- silicium 34 Treffer
- tecnologia mos complementario 34 Treffer
- degradation 32 Treffer
Verlag
- institute of electrical and electronics engineers 141 Treffer
- ieee 41 Treffer
- elsevier science 40 Treffer
- elsevier 19 Treffer
- institute of electrical and electronics engineers, inc. 17 Treffer
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38 weitere Werte:
- institution of electrical engineers 15 Treffer
- newsrx llc 13 Treffer
- spie 13 Treffer
- oxford university press 7 Treffer
- taylor & francis 7 Treffer
- iop publishing 6 Treffer
- wiley-blackwell 6 Treffer
- institute of physics 5 Treffer
- institution of engineering & technology 4 Treffer
- japanese journal of applied physics 4 Treffer
- taylor & francis ltd 4 Treffer
- university of bologna 4 Treffer
- taylor and francis 3 Treffer
- vasteras : institutionen for datavetenskap och elektronik 3 Treffer
- electrochemical society 2 Treffer
- institute of electrical and electronics engineers (ieee) 2 Treffer
- malardalens hogskola, institutionen for datavetenskap och elektronik 2 Treffer
- mdpi ag 2 Treffer
- wiley-vch 2 Treffer
- akademie verlag gmbh 1 Treffer
- american scientific publishers 1 Treffer
- elsevier b.v. 1 Treffer
- institute of electronics, information and communication engineers 1 Treffer
- institution of electrical engineers, publishing department 1 Treffer
- institution of engineering and technology 1 Treffer
- intitute of electrical and electronics engineers 1 Treffer
- malardalen university, department of computer science and electronics 1 Treffer
- materials park, ohio; asm international; c 1 Treffer
- pennington, nj; electrochemical society; c 1 Treffer
- pergamon 1 Treffer
- reed business information ltd. (australia) 1 Treffer
- schiele & schon 1 Treffer
- society for information display 1 Treffer
- springer international publishing 1 Treffer
- springer-verlag 1 Treffer
- telecommunications association 1 Treffer
- the electrochemical society 1 Treffer
- the society 1 Treffer
Publikation
- i.e.e.e. transactions on electron devices 78 Treffer
- ieee electron device letters 60 Treffer
- solid-state electronics 32 Treffer
- ieee transactions on electron devices 29 Treffer
- electronics letters 13 Treffer
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45 weitere Werte:
- electronics newsweekly 13 Treffer
- microelectronics and reliability 12 Treffer
- international journal of electronics 11 Treffer
- spie proceedings series 11 Treffer
- ieee transactions on nuclear science 7 Treffer
- ieice transactions on electronics 7 Treffer
- electronics & communications in japan, part 2: electronics 6 Treffer
- microelectronic engineering 6 Treffer
- semiconductor science & technology 6 Treffer
- semiconductor science and technology 5 Treffer
- electronics letters (institution of engineering & technology) 4 Treffer
- essderc 2002 : 32nd european solid-state device research conference (firenze, 24-26 september 2002) 4 Treffer
- japanese journal of applied physics 4 Treffer
- microelectronics journal 4 Treffer
- 2002 ieee international reliability physics symposium proceedings (dallas tx, 7-11 april 2002) 3 Treffer
- active and passive electronic components 3 Treffer
- ieee transactions on semiconductor manufacturing 3 Treffer
- proceedings- electrochemical society pv 3 Treffer
- thin solid films 3 Treffer
- 2002 ieee international soi conference (williamsburg va, 7-10 october 2002) 2 Treffer
- 32nd ieee international symposium on multiple-valued logic (boston ma, 15-18 may 2002) 2 Treffer
- ieee international electron devices meeting 2004 (iedm technical digest) 2 Treffer
- ieee transactions on circuits and systems-ii: analog and digital... 2 Treffer
- malardalen university press dissertations 2 Treffer
- microelectronic device technology iii (santa clara ca, 22-23 september 1999) 2 Treffer
- microelectronic manufacturing yield, reliability, and failure analysis iv (santa clara ca, 23-24 september 1998) 2 Treffer
- physica status solidi. a. applied research 2 Treffer
- proceedings - international symposium on multiple-valued logic 2 Treffer
- smart structures, devices, and systems (melbourne, 16-18 december 2002) 2 Treffer
- [proceedings] 1993 international workshop on vlsi process and device modeling (1993 vpad) 1 Treffer
- 0icmne-2005 1 Treffer
- 12th international symposium on power semiconductor devices & ics (toulouse, 22-25 may 2000) 1 Treffer
- 1993 international symposium on vlsi technology, systems, and applications proceedings of technical papers 1 Treffer
- 1997 symposium on electrical overstress/electrostatic discharge (eos/esd) 1 Treffer
- 2004 silicon nanoelectronics workshop, honolulu, hi, usa, 13-14 june 2004 1 Treffer
- electronics 1 Treffer
- electronics news 1 Treffer
- ieee letters on electromagnetic compatibility practice and applications 1 Treffer
- ieee transactions on circuits and systems-i: fundamental theory... 1 Treffer
- ieee transactions on electromagnetic compatibility 1 Treffer
- ieee transactions on neural networks 1 Treffer
- ieee transactions on vehicular technology 1 Treffer
- international symposium for testing and failure analysis 1 Treffer
- physica status solidi a-applied research 1 Treffer
- spie proceedings 1 Treffer
Sprache
Geographischer Bezug
386 Treffer
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In: I.E.E.E. transactions on electron devices, Jg. 59 (2012), Heft 3, S. 705-709Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 57 (2010), Heft 11, S. 2892-2901Online academicJournalZugriff:
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In: IEICE transactions on electronics, Jg. 90 (2007), Heft 5, S. 983-987Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 33 (2012), Heft 5, S. 682-684Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 32 (2011), Heft 8, S. 1038-1040Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 32 (2011), Heft 6, S. 764-766Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 20 (2007), Heft 3, S. 313-322Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 30 (2009), Heft 1, S. 88-90Online academicJournalZugriff:
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In: Active and passive electronic components, Jg. 26 (2003), Heft 4, S. 197-204Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 29 (2008), Heft 9, S. 1034-1036Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 28 (2007), Heft 3, S. 189-191Online academicJournalZugriff:
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In: IEEE microwave and wireless components letters, Jg. 17 (2007), Heft 6, S. 445-447Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-12-01), Heft 12, S. 164-174Online academicJournalZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, Jg. CONF 36TH (2010), S. 403-408KonferenzZugriff:
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In: Proceedings of Symposium K on Thin Film Materials for Large Area Electronics of the E-MRS 2002 Spring Conference, Strasbourg, France, June 18-21, Jg. 427 (2003), Heft 1-2, S. 117-122KonferenzZugriff:
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In: Smart structures, devices, and systems (Melbourne, 16-18 December 2002), 2002, S. 316-324KonferenzZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 37 (1990), Heft 10, S. 2254-2264Online academicJournalZugriff:
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In: Proceedings of the Twelfth International Conference on Nonequilibrium Carrier Dynamics in Semiconductors, Jg. 314 (2002), Heft 1-4, S. 391-395KonferenzZugriff:
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1.1W/mm high power GaAs/InGaP composite channel FET with asymmetrical LDD structure at 26V operationIn: GaAs IC symposium (Monterey CA, 20-23 October 2002), 2002, S. 151-154KonferenzZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 53 (2006), Heft 1, S. 43-50Online academicJournalZugriff: