Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- business 247 Treffer
- business.industry 247 Treffer
- materials science 246 Treffer
- optoelectronics 204 Treffer
- chemistry 196 Treffer
-
45 weitere Werte:
- optics 187 Treffer
- chemistry.chemical_compound 166 Treffer
- law 153 Treffer
- law.invention 153 Treffer
- epitaxy 124 Treffer
- mercury cadmium telluride 92 Treffer
- physics 83 Treffer
- photodiode 80 Treffer
- electronics 73 Treffer
- electronique 66 Treffer
- exact sciences and technology 66 Treffer
- optique 66 Treffer
- physique 66 Treffer
- sciences exactes et technologie 66 Treffer
- detector 56 Treffer
- chemistry.chemical_element 54 Treffer
- heterojunction 54 Treffer
- laser 51 Treffer
- diode 48 Treffer
- analytical chemistry 45 Treffer
- telecommunications 45 Treffer
- gallium arsenide 43 Treffer
- molecular beam epitaxy 43 Treffer
- lpe 40 Treffer
- applied sciences 39 Treffer
- sciences appliquees 39 Treffer
- doping 36 Treffer
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 35 Treffer
- epitaxie phase liquide 35 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 35 Treffer
- dark current 33 Treffer
- semiconductor laser theory 33 Treffer
- substrate (electronics) 29 Treffer
- metalorganic vapour phase epitaxy 26 Treffer
- optoelectronic devices 26 Treffer
- dispositifs optoelectroniques 25 Treffer
- photodetector 25 Treffer
- wafer 24 Treffer
- quantum efficiency 23 Treffer
- cadmium telluride photovoltaics 22 Treffer
- liquid phase 22 Treffer
- crystallography 21 Treffer
- fabrication 21 Treffer
- metrologie et instrumentation 21 Treffer
- metrology and instrumentation 21 Treffer
Publikation
- spie proceedings 232 Treffer
- spie proceedings series 40 Treffer
- proceedings of spie - the international society for optical engineering 29 Treffer
- proceedings of spie, the international society for optical engineering 23 Treffer
- proceedings- spie the international society for optical engineering 18 Treffer
-
45 weitere Werte:
- epilayers and heterostructures in optoelectronics and semiconductor technology (zakopane, 9-13 october 2000) 5 Treffer
- physics of semiconductor devices (delhi, 11-15 december 2001) 5 Treffer
- physics of semiconductor devices (delhi, 14-18 december 1999) 5 Treffer
- semiconductor growth technology ; spie proceedings ; issn 0277-786x 4 Treffer
- semiconductors lasers iii (beijing, 18-19 september 1998) 4 Treffer
- detectors and associated signal processing ii (13-14 september 2005, jena, germany) 3 Treffer
- spie proceedings ; international symposium on photoelectronic detection and imaging 2011: advances in infrared imaging and applications ; issn 0277-786x 3 Treffer
- spie proceedings ; producibility of ii-vi materials and devices ; issn 0277-786x 3 Treffer
- detectors and associated signal processing ii ; spie proceedings ; issn 0277-786x 2 Treffer
- fourth international conference on thin film physics and applications ; spie proceedings ; issn 0277-786x 2 Treffer
- spie proceedings ; materials technologies for infrared detectors ; issn 0277-786x 2 Treffer
- spie proceedings ; semiconductor lasers iii ; issn 0277-786x 2 Treffer
- 6th mtg in israel on optical engineering ; spie proceedings ; issn 0277-786x 1 Treffer
- fundamentals of infrared detector materials 1 Treffer
- future infrared detector materials ; spie proceedings ; issn 0277-786x 1 Treffer
- infrared detectors: state of the art ; spie proceedings ; issn 0277-786x 1 Treffer
- laser diode technology and applications iv ; spie proceedings ; issn 0277-786x 1 Treffer
- optoelectronic integrated circuit materials, physics, and devices ; spie proceedings ; issn 0277-786x 1 Treffer
- spie proceedings ; 13th intl conf on infrared and millimeter waves ; issn 0277-786x 1 Treffer
- spie proceedings ; 5th international symposium on advanced optical manufacturing and testing technologies: optoelectronic materials and devices for detector, imager, display, and energy conversion technology ; issn 0277-786x 1 Treffer
- spie proceedings ; 6th international symposium on advanced optical manufacturing and testing technologies: optoelectronic materials and devices for sensing, imaging, and solar energy ; issn 0277-786x 1 Treffer
- spie proceedings ; design, fabrication, and characterization of photonic devices ; issn 0277-786x 1 Treffer
- spie proceedings ; detectors, focal plane arrays, and applications ; issn 0277-786x 1 Treffer
- spie proceedings ; emerging optoelectronic technologies ; issn 0277-786x 1 Treffer
- spie proceedings ; focal plane arrays: technology and applications ; issn 0277-786x 1 Treffer
- spie proceedings ; gallium nitride materials and devices iv ; issn 0277-786x 1 Treffer
- spie proceedings ; growth of compound semiconductor structures ii ; issn 0277-786x 1 Treffer
- spie proceedings ; infrared and optoelectronic materials and devices ; issn 0277-786x 1 Treffer
- spie proceedings ; infrared detector materials ; issn 0277-786x 1 Treffer
- spie proceedings ; infrared focal plane array producibility and related materials ; issn 0277-786x 1 Treffer
- spie proceedings ; infrared technology and applications xxxviii ; issn 0277-786x 1 Treffer
- spie proceedings ; infrared technology xix ; issn 0277-786x 1 Treffer
- spie proceedings ; integrated optics and optoelectronics ; issn 0277-786x 1 Treffer
- spie proceedings ; international conference on solid state crystals 2000: epilayers and heterostructures in optoelectronics and semiconductor technology ; issn 0277-786x 1 Treffer
- spie proceedings ; issn 0277-786x 1 Treffer
- spie proceedings ; laser diode technology and applications ; issn 0277-786x 1 Treffer
- spie proceedings ; modern optical characterization techniques for semiconductors and semiconductor devices ; issn 0277-786x 1 Treffer
- spie proceedings ; nano-optics and nano-structures ; issn 0277-786x 1 Treffer
- spie proceedings ; optical diagnostics of materials and devices for opto-, micro-, and quantum electronics ; issn 0277-786x 1 Treffer
- spie proceedings ; photodetectors: materials and devices iv ; issn 0277-786x 1 Treffer
- spie proceedings ; picosecond optoelectronics ; issn 0277-786x 1 Treffer
- spie proceedings ; semiconductor lasers and applications ii ; issn 0277-786x 1 Treffer
- spie proceedings ; semiconductor lasers ii ; issn 0277-786x 1 Treffer
- spie proceedings ; sixth international conference on advanced optical materials and devices (aomd-6) ; issn 0277-786x 1 Treffer
- third international conference on thin film physics and applications ; spie proceedings ; issn 0277-786x 1 Treffer
Sprache
459 Treffer
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Jg. 5628 (2005), S. 223-227KonferenzZugriff:
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Jg. 5136 (2003), S. 268-273KonferenzZugriff:
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Jg. 4923 (2002), S. 41-46KonferenzZugriff:
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Jg. 4413 (2001), S. 96-101KonferenzZugriff:
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Jg. 3948 (2000), S. 382-388KonferenzZugriff:
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Jg. 3896 (1999), S. 507-514KonferenzZugriff:
-
In: Design, fabrication, and characterization of photonic devices (Singapore, 30 November - 3 December 1999), 1999, S. 507-514KonferenzZugriff:
-
In: Detectors and associated signal processing II (13-14 September 2005, Jena, Germany), 2005, S. 59640Y.1KonferenzZugriff:
-
In: Detectors and associated signal processing II (13-14 September 2005, Jena, Germany), 2005, S. 596405.1KonferenzZugriff:
-
In: Photodetectors : materials and devices IV (San Jose CA, 27-29 January 1999), 1999, S. 88-97KonferenzZugriff:
-
In: Epilayers and heterostructures in optoelectronics and semiconductor technology (Zakopane, 9-13 October 2000), 2001, S. 96-101KonferenzZugriff:
-
In: Physics of semiconductor devices (Delhi, 11-15 December 2001), 2002, S. 1061-1063KonferenzZugriff:
-
In: Physics of semiconductor devices (Delhi, 11-15 December 2001), 2002, S. 1152-1154KonferenzZugriff:
-
In: Physics of semiconductor devices (Delhi, 11-15 December 2001), 2002, S. 1108-1110KonferenzZugriff:
-
In: Semiconductors lasers III (Beijing, 18-19 September 1998), 1998, S. 118-120KonferenzZugriff:
-
In: Semiconductors lasers III (Beijing, 18-19 September 1998), 1998, S. 108-110KonferenzZugriff:
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, , Heft E 3629, S. 88-99KonferenzZugriff:
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, , Heft E 2894, S. 269-275KonferenzZugriff:
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, , Heft E 2397, S. 661-665KonferenzZugriff:
-
In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, , Heft E 2228, S. 342-361KonferenzZugriff: