RADIATION DOSIMETRY PROPERTIES OF SMARTPHONE CMOS SENSORS.
In: Radiation Protection Dosimetry, Jg. 168 (2016-03-01), Heft 3, S. 314-321
Online
academicJournal
Zugriff:
Titel: |
RADIATION DOSIMETRY PROPERTIES OF SMARTPHONE CMOS SENSORS.
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Autor/in / Beteiligte Person: | Van Hoey, Olivier ; Salavrakos, Alexia ; Marques, Antonio ; Nagao, Alexandre ; Willems, Ruben ; Vanhavere, Filip ; Cauwels, Vanessa ; Nascimento, Luana F. |
Link: | |
Zeitschrift: | Radiation Protection Dosimetry, Jg. 168 (2016-03-01), Heft 3, S. 314-321 |
Veröffentlichung: | 2016 |
Medientyp: | academicJournal |
ISSN: | 0144-8420 (print) |
DOI: | 10.1093/rpd/ncv352 |
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