An Experimental Demonstration of GaN CMOS Technology.
In: IEEE Electron Device Letters, Jg. 37 (2016-03-01), Heft 3, S. 269-271
Online
academicJournal
Zugriff:
Titel: |
An Experimental Demonstration of GaN CMOS Technology.
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Autor/in / Beteiligte Person: | Chu, Rongming ; Cao, Yu ; Chen, Mary ; Li, Ray ; Zehnder, Daniel |
Link: | |
Zeitschrift: | IEEE Electron Device Letters, Jg. 37 (2016-03-01), Heft 3, S. 269-271 |
Veröffentlichung: | 2016 |
Medientyp: | academicJournal |
ISSN: | 0741-3106 (print) |
DOI: | 10.1109/LED.2016.2515103 |
Sonstiges: |
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