The Characteristics of Binary Spike-Time-Dependent Plasticity in HfO-Based RRAM and Applications for Pattern Recognition.
In: Nanoscale Research Letters, Jg. 12 (2017-04-04), Heft 1, S. 1-5
Online
academicJournal
Zugriff:
Titel: |
The Characteristics of Binary Spike-Time-Dependent Plasticity in HfO-Based RRAM and Applications for Pattern Recognition.
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Autor/in / Beteiligte Person: | Zhou, Zheng ; Liu, Chen ; Shen, Wensheng ; Dong, Zhen ; Chen, Zhe ; Huang, Peng ; Liu, Lifeng ; Liu, Xiaoyan ; Kang, Jinfeng |
Link: | |
Zeitschrift: | Nanoscale Research Letters, Jg. 12 (2017-04-04), Heft 1, S. 1-5 |
Veröffentlichung: | 2017 |
Medientyp: | academicJournal |
ISSN: | 1931-7573 (print) |
DOI: | 10.1186/s11671-017-2023-y |
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