Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node.
In: IEEE Electron Device Letters, Jg. 40 (2019-06-01), Heft 6, S. 985-988
Online
academicJournal
Zugriff:
Titel: |
Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node.
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Autor/in / Beteiligte Person: | Kushwaha, Pragya ; Agarwal, Harshit ; Lin, Yen-Kai ; Dasgupta, Avirup ; Kao, Ming-Yen ; Lu, Ye ; Yue, Yun ; Chen, Xiaonan ; Wang, Joseph ; Sy, Wing ; Yang, Frank ; Chidambaram, PR. Chidi ; Salahuddin, Sayeef ; Hu, Chenming |
Link: | |
Zeitschrift: | IEEE Electron Device Letters, Jg. 40 (2019-06-01), Heft 6, S. 985-988 |
Veröffentlichung: | 2019 |
Medientyp: | academicJournal |
ISSN: | 0741-3106 (print) |
DOI: | 10.1109/LED.2019.2911614 |
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