Noise analysis of replica driving technique and its verification to 12‐bit 200 MS/s pipelined ADC.
In: IET Circuits, Devices & Systems (Wiley-Blackwell), Jg. 13 (2019-11-01), Heft 8, S. 1277-1283
Online
academicJournal
Zugriff:
Titel: |
Noise analysis of replica driving technique and its verification to 12‐bit 200 MS/s pipelined ADC.
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Autor/in / Beteiligte Person: | Lee, Chang‐Kyo ; Ryu, Seung‐Tak |
Link: | |
Zeitschrift: | IET Circuits, Devices & Systems (Wiley-Blackwell), Jg. 13 (2019-11-01), Heft 8, S. 1277-1283 |
Veröffentlichung: | 2019 |
Medientyp: | academicJournal |
ISSN: | 1751-858X (print) |
DOI: | 10.1049/iet-cds.2018.5308 |
Sonstiges: |
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