Impact of Cu Pillar Bump Diameter and Solder Material on Reflow Soldering: A Computational Study with Thermal Fluid–Structure Interaction.
In: Journal of Electronic Materials, Jg. 53 (2024-03-01), Heft 3, S. 1201-1213
Online
academicJournal
Zugriff:
Titel: |
Impact of Cu Pillar Bump Diameter and Solder Material on Reflow Soldering: A Computational Study with Thermal Fluid–Structure Interaction.
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Autor/in / Beteiligte Person: | Lee, Jing Rou ; Abdul Aziz, Mohd Sharizal ; Khor, Chu Yee ; Ishak, Mohammad Hafifi Hafiz ; Kamarudin, Roslan ; Ani, F. Che |
Link: | |
Zeitschrift: | Journal of Electronic Materials, Jg. 53 (2024-03-01), Heft 3, S. 1201-1213 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0361-5235 (print) |
DOI: | 10.1007/s11664-023-10855-3 |
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